Search Results - "OOKI, Hiroshi" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Generalizing effective point spread function and its application to the phase-contrast microscope

Generalizing effective point spread function and its application to the phase-contrast microscope

by SHIBUYA, Masato, OOKI, Hiroshi, SAITO, Kimihiro, NAKADATE, Suezou
Published in Optical review (01.03.2005)

Get full text

Conference Proceeding Journal Article

Polarization Effect on Signal from Optical ROM Using Solid Immersion Lens

Polarization Effect on Signal from Optical ROM Using Solid Immersion Lens

by Otaki, Katsura, Osawa, Hisao, Ooki, Hiroshi, Saito, Jun
Published in JPN J APPL PHYS PART 1 REGUL PAP SHORT NOTE REV PAP (2000)

Get full text

Journal Article

Sampled servo read only memory system using single carrier independent pit edge recording

Sampled servo read only memory system using single carrier independent pit edge recording

by DE KOCK, J. P, KOBAYASHI, S, ISHIMOTO, T, YAMATSU, H, OOKI, H
Published in Japanese Journal of Applied Physics (1996)

Get full text

Conference Proceeding Journal Article

Optical disc track pitch variation measurement using two readout beams

Optical disc track pitch variation measurement using two readout beams

by KUROKAWA, K, EGUCHI, N, ARAI, M, MASUHARA, S, OOKI, H
Published in Japanese Journal of Applied Physics (1996)

Get full text

Conference Proceeding Journal Article

Crosstalk-Free Condition for Land/Groove Recording of Optical Discs

Crosstalk-Free Condition for Land/Groove Recording of Optical Discs

by Ooki, Hiroshi
Published in Optical review (Tokyo, Japan) (01.01.1995)

Get full text

Journal Article

Performance of resolution enhancement technique using both multiple exposure and nonlinear resist

Performance of resolution enhancement technique using both multiple exposure and nonlinear resist

by SHIBUYA, M, KOMATSU, M, OZAWA, T, OOKI, H
Published in Japanese Journal of Applied Physics (1994)

Get full text

Journal Article

COPY PROCESSING MANAGEMENT SYSTEM AND COPY PROCESSING MANAGEMENT METHOD

COPY PROCESSING MANAGEMENT SYSTEM AND COPY PROCESSING MANAGEMENT METHOD

by OOKI, HIROSHI, MAEDA, SHINGO, SAKAI, ATSUSHI
Year of Publication 12.05.2016

Get full text

Patent

MICROSCOPE OBSERVATION METHOD, MICROSCOPE, DIFFERENTIATION INTERFERENCE MICROSCOPE, PHASE DIFFERENCE MICROSCOPE, INTERFERENCE MICROSCOPE, IMAGE PROCESSING METHOD, AND IMAGE PROCESSING DEVICE

MICROSCOPE OBSERVATION METHOD, MICROSCOPE, DIFFERENTIATION INTERFERENCE MICROSCOPE, PHASE DIFFERENCE MICROSCOPE, INTERFERENCE MICROSCOPE, IMAGE PROCESSING METHOD, AND IMAGE PROCESSING DEVICE

by OOKI, HIROSHI
Year of Publication 16.02.2006

Get full text

Patent

MICROSCOPE OBSERVATION METHOD, MICROSCOPE, DIFFERENTIATION INTERFERENCE MICROSCOPE, PHASE DIFFERENCE MICROSCOPE, INTERFERENCE MICROSCOPE, IMAGE PROCESSING METHOD, AND IMAGE PROCESSING DEVICE

MICROSCOPE OBSERVATION METHOD, MICROSCOPE, DIFFERENTIATION INTERFERENCE MICROSCOPE, PHASE DIFFERENCE MICROSCOPE, INTERFERENCE MICROSCOPE, IMAGE PROCESSING METHOD, AND IMAGE PROCESSING DEVICE

by OOKI, HIROSHI
Year of Publication 12.01.2006

Get full text

Patent

A novel super-resolution technique for optical lithography-nonlinear multiple exposure method

A novel super-resolution technique for optical lithography-nonlinear multiple exposure method

by OOKI, H, KOMATSU, M, SHIBUYA, M
Published in Japanese Journal of Applied Physics (1994)

Get full text

Journal Article

OPTICAL CHARACTERISTIC MEASURING METHOD, OPTICAL CHARACTERISTIC ADJUSTING METHOD, EXPOSING DEVICE, EXPOSING METHOD, AND EXPOSING DEVICE MANUFACTURING METHOD

OPTICAL CHARACTERISTIC MEASURING METHOD, OPTICAL CHARACTERISTIC ADJUSTING METHOD, EXPOSING DEVICE, EXPOSING METHOD, AND EXPOSING DEVICE MANUFACTURING METHOD

by NAKAMURA AYAKO, OOKI HIROSHI
Year of Publication 12.05.2010

Get full text

Patent

ILLUMINATION OPTICAL ASSEMBLY, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD

ILLUMINATION OPTICAL ASSEMBLY, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD

by TANAKA HIROHISA, OOKI HIROSHI, NAKAJIMA SHINICHI
Year of Publication 09.07.2014

Get full text

Patent

International Conference on Optics-Photonics Design and Fabrication (ODF'06)

International Conference on Optics-Photonics Design and Fabrication (ODF'06)

by OOKI, Hiroshi
Published in Optical review (2007)

Get full text

Conference Proceeding

Laser scanning mode interference contrast microscope and its application to step height measurement

Laser scanning mode interference contrast microscope and its application to step height measurement

by OOKI, H, ARIMOTO, R, SHIONOYA, T, MATSUURA, K, IWASAKI, J
Published in Japanese Journal of Applied Physics (01.11.1993)

Get full text

Journal Article

OPTICAL CHARACTERISTIC MEASURING METHOD, OPTICAL CHARACTERISTIC ADJUSTING METHOD, EXPOSING DEVICE, EXPOSING METHOD, AND EXPOSING DEVICE MANUFACTURING METHOD

OPTICAL CHARACTERISTIC MEASURING METHOD, OPTICAL CHARACTERISTIC ADJUSTING METHOD, EXPOSING DEVICE, EXPOSING METHOD, AND EXPOSING DEVICE MANUFACTURING METHOD

by OOKI, HIROSHI, NAKAMURA, AYAKO
Year of Publication 31.12.2008

Get full text

Patent

ILLUMINATION OPTICAL ASSEMBLY, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD

ILLUMINATION OPTICAL ASSEMBLY, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD

by TANAKA HIROHISA, OOKI HIROSHI, NAKAJIMA SHINICHI
Year of Publication 02.05.2013

Get full text

Patent

A Novel Super Resolution Technique for High-Density Optical Data Storage using Mode Interference in Channel Waveguides

A Novel Super Resolution Technique for High-Density Optical Data Storage using Mode Interference in Channel Waveguides

by Ooki, Hiroshi, Arimoto, Rieko, Yutaka Iwasaki, Yutaka Iwasaki, Jun Iwasaki, Jun Iwasaki
Published in JPN J APPL PHYS PART 1 REGUL PAP SHORT NOTE REV PAP (01.04.1993)

Get full text

Journal Article

OPTICAL CHARACTERISTIC MEASURING METHOD, OPTICAL CHARACTERISTIC ADJUSTING METHOD, EXPOSING DEVICE, AND EXPOSING METHOD

OPTICAL CHARACTERISTIC MEASURING METHOD, OPTICAL CHARACTERISTIC ADJUSTING METHOD, EXPOSING DEVICE, AND EXPOSING METHOD

by OOKI, Hiroshi, NAKAMURA, Ayako
Year of Publication 17.04.2019

Get full text

Patent

Optical characteristic measuring method, optical characteristic adjusting method, exposure apparatus, exposing method, and exposure apparatus manufacturing method by detecting a light amount of measuring light

Optical characteristic measuring method, optical characteristic adjusting method, exposure apparatus, exposing method, and exposure apparatus manufacturing method by detecting a light amount of measuring light

by Nakamura, Ayako, Ooki, Hiroshi
Year of Publication 05.03.2019

Get full text

Patent

In-Line Holographic Lenses

In-Line Holographic Lenses

by KOJIMA, Chiaki, OOKI, Hiroshi
Published in Kogaku (Japanese journal of optics) (10.12.1981)

Get full text

Journal Article

1
2
3
4
5
6
7
Next
[7]