Investigation of Device Performance and Negative Bias Temperature Instability of Plasma Nitrided Oxide in Nanoscale p-Channel Metal–Oxide–Semiconductor Field-Effect Transistor's
Han, In-Shik, Ji, Hee-Hwan, Goo, Tae-Gyu, Yoo, Ook-Sang, Choi, Won-Ho, Kim, Yong-Goo, Park, Sung-Hyung, Lee, Heui-Seung, Kang, Young-Seok, Kim, Dae-Byung, Lee, Hi-Deok
Published in Japanese Journal of Applied Physics (01.04.2008)
Published in Japanese Journal of Applied Physics (01.04.2008)
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Journal Article
PBTI-Associated High-Temperature Hot Carrier Degradation of nMOSFETs With Metal-Gate/High- k Dielectrics
Kyong Taek Lee, Chang Yong Kang, Ook Sang Yoo, Rino Choi, Byoung Hun Lee, Lee, J.C., Hi-Deok Lee, Yoon-Ha Jeong
Published in IEEE electron device letters (01.04.2008)
Published in IEEE electron device letters (01.04.2008)
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Journal Article
Characterization of device performance and reliability of high performance Ge-on-Si field-effect transistor
Choi, Won-Ho, Oh, Jungwoo, Yoo, Ook-Sang, Han, In-Shik, Na, Min-Ki, Kwon, Hyuk-Min, Park, Byung-Suk, Majhi, P., Tseng, H.-H., Jammy, R., Lee, Hi-Deok
Published in Microelectronic engineering (01.12.2011)
Published in Microelectronic engineering (01.12.2011)
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Journal Article
Conference Proceeding
Effect of Si capping layer on the interface quality and NBTI of high mobility channel Ge-on-Si pMOSFETs
Yoo, Ook Sang, Oh, Jungwoo, Min, Kyung Seok, Kang, Chang Yong, Lee, B.H., Lee, Kyong Taek, Na, Min Ki, Kwon, Hyuk-Min, Majhi, P., Tseng, H-H, Jammy, Raj, Wang, J.S., Lee, Hi-Deok
Published in Microelectronic engineering (01.03.2009)
Published in Microelectronic engineering (01.03.2009)
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Journal Article
Conference Proceeding
Effects of In Situ O2 Plasma Treatment on OFF-State Leakage and Reliability in Metal-Gate/High-k Dielectric MOSFETs
KYONG TAEK LEE, CHANG YONG KANG, JEONG, Yoon-Ha, BYUNG SUN JU, CHOI, Rino, KYUNG SEOK MIN, OOK SANG YOO, BYOUNG HUN LEE, JAMMY, Raj, LEE, Jack C, LEE, Hi-Deok
Published in IEEE electron device letters (01.06.2008)
Published in IEEE electron device letters (01.06.2008)
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Journal Article
Comparison of La-based high- k dielectrics: HfLaSiON and HfLaON
Choi, Won-Ho, Han, In-Shik, Kwon, Hyuk-Min, Goo, Tae-Gyu, Na, Min-Ki, Yoo, Ook-Sang, Lee, Ga-Won, Kang, Chang Yong, Choi, Rino, Song, Seung Chul, Lee, Byoung Hun, Jammy, Raj, Jeong, Yoon-Ha, Lee, Hi-Deok
Published in Microelectronic engineering (01.03.2009)
Published in Microelectronic engineering (01.03.2009)
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Journal Article
Conference Proceeding
Effect of Si interlayer thickness and post-metallization annealing on Ge MOS capacitor on Ge-on-Si substrate
Yoo, Ook Sang, Oh, Jungwoo, Kang, Chang Yong, Lee, Byoung Hun, Han, In Shik, Choi, Won-Ho, Kwon, Hyuk-Min, Na, Min-Ki, Majhi, Prashant, Tseng, Hsing-Huang, Jammy, Raj, Wang, Jin Suk, Lee, Hi-Deok
Published in Materials science & engineering. B, Solid-state materials for advanced technology (05.12.2008)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (05.12.2008)
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Journal Article
Plasma induced damage of aggressively scaled gate dielectric (EOT ≪ 1.0nm) in metal gate/high-k dielectric CMOSFETs
Kyung Seok Min, Chang Yong Kang, Ook Sang Yoo, Byoung Jae Park, Sung Woo Kim, Young, C.D., Dawei Heh, Bersuker, G., Byoung Hun Lee, Geun Young Yeom
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
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Conference Proceeding
A comparative study of reliability and performance of strain engineering using CESL stressor and mechanical strain
Kyong Taek Lee, Chang Yong Kang, Ook Sang Yoo, Chadwin, D., Bersuker, G., Ho Kyung Park, Jun Myung Lee, Hyung Sang Hwang, Byoung Hun Lee, Hi-Deok Lee, Yoon-Ha Jeong
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
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Conference Proceeding
Impact of initial-oxidation on 1/f noise and subthreshold swing of n-channel MOSFETs
Han-Soo Joo, In-Shik Han, Tae-Kyu Goo, Ook-Sang Yoo, Won-Ho Choi, Ga-Won Lee, Hi-Deok Lee
Published in 2006 IEEE Nanotechnology Materials and Devices Conference (01.10.2006)
Published in 2006 IEEE Nanotechnology Materials and Devices Conference (01.10.2006)
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Conference Proceeding
PBTI-Associated High-Temperature Hot Carrier Degradation of nMOSFETs With Metal-Gate/High- [Formula Omitted] Dielectrics
Lee, Kyong Taek, Kang, Chang Yong, Yoo, Ook Sang, Choi, Rino, Lee, Byoung Hun, Lee, J.C, Lee, Hi-Deok, Jeong, Yoon-Ha
Published in IEEE electron device letters (01.04.2008)
Published in IEEE electron device letters (01.04.2008)
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Journal Article
Effects of In Situ [Formula Omitted] Plasma Treatment on off-State Leakage and Reliability in Metal-Gate/High- [Formula Omitted] Dielectric MOSFETs
Lee, Kyong Taek, Kang, Chang Yong, Ju, Byung Sun, Choi, R, Min, Kyung Seok, Yoo, Ook Sang, Lee, Byoung Hun, Jammy, R, Lee, J.C, Lee, Hi-Deok, Jeong, Yoon-Ha
Published in IEEE electron device letters (01.06.2008)
Published in IEEE electron device letters (01.06.2008)
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Journal Article
Effects of In Situ \hbox Plasma Treatment on off-State Leakage and Reliability in Metal-Gate/High- k Dielectric MOSFETs
Kyong Taek Lee, Chang Yong Kang, Byung Sun Ju, Choi, R., Kyung Seok Min, Ook Sang Yoo, Byoung Hun Lee, Jammy, R., Lee, J.C., Hi-Deok Lee, Yoon-Ha Jeong
Published in IEEE electron device letters (01.06.2008)
Published in IEEE electron device letters (01.06.2008)
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Journal Article
ALGORITHM AND METHOD FOR DYNAMICALLY VARYING QUANTIZATION PRECISION OF DEEP LEARNING NETWORK
LIM, Kyeong Jong, LEE, Hyuk Jae, RYU, Soo Jung, YOO, Ook Sang, CHON, Ji Yea
Year of Publication 22.02.2024
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Year of Publication 22.02.2024
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