Retention Characteristics of Commercial NAND Flash Memory After Radiation Exposure
Oldham, T. R., Dakai Chen, Friendlich, M. R., LaBel, K. A.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
Impact of Spacecraft Shielding on Direct Ionization Soft Error Rates for Sub-130 nm Technologies
Pellish, Jonathan A, Xapsos, Michael A, Stauffer, Craig A, Jordan, Thomas M, Sanders, Anthony B, Ladbury, Raymond L, Oldham, Timothy R, Marshall, Paul W, Heidel, David F, Rodbell, Kenneth P
Published in IEEE transactions on nuclear science (01.12.2010)
Published in IEEE transactions on nuclear science (01.12.2010)
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Journal Article
Correlation of Laser Test Results With Heavy Ion Results for NAND Flash Memory
Oldham, T. R., Friendlich, M. R., Wilcox, E. P., LaBel, K. A., Buchner, S. P., McMorrow, D., Mavis, D. G., Eaton, P. H., Castillo, J.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA
Cochran, Donna J, Dakai Chen, Oldham, Timothy R, Sanders, Anthony B, Kim, Hak S, Campola, Michael J, Buchner, Stephen P, LaBel, Kenneth A, Marshall, Cheryl J, Pellish, Jonathan A, Carts, Martin A, O'Bryan, Martha V
Published in 2010 IEEE Radiation Effects Data Workshop (01.07.2010)
Published in 2010 IEEE Radiation Effects Data Workshop (01.07.2010)
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Conference Proceeding
Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA
O'Bryan, Martha V, LaBel, Kenneth A, Pellish, Jonathan A, Dakai Chen, Lauenstein, Jean-Marie, Marshall, Cheryl J, Ladbury, Ray L, Oldham, Timothy R, Kim, Hak S, Phan, Anthony M, Berg, Melanie D, Carts, Martin A, Sanders, Anthony B, Buchner, Stephen P, Marshall, Paul W, Xapsos, Michael A, Irom, Farokh, Pearce, Larry G, Thomson, Eric T, Bernard, Theju M, Satterfield, Harold W, Williams, Alan P, van Vonno, Nick W, Salzman, James F, Burns, Sam, Albarian, Rafi S
Published in 2010 IEEE Radiation Effects Data Workshop (01.07.2010)
Published in 2010 IEEE Radiation Effects Data Workshop (01.07.2010)
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Conference Proceeding
Compendium of Ball Aerospace Total Ionizing Dose Test Results
Griffiths, Benjamin J., Oldham, Timothy R., Whitney, Chad M.
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01.07.2018)
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01.07.2018)
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Conference Proceeding
Summary and Analysis of Neutron Displacement Damage Results
Oldham, Timothy R., Whitney, Chad M., Griffiths, Benjamin J., van Vonno, Nick
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01.07.2018)
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01.07.2018)
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Conference Proceeding
Electrostatic as well as hydrophobic interactions are important for the association of Cpn60 (groEL) with peptides
Hutchinson, Jonathan P., Oldham, Timothy C., El-Thaher, Talal S. H., Miller, Andrew D.
Published in Journal of the Chemical Society, Perkin Transactions 2 (1997)
Published in Journal of the Chemical Society, Perkin Transactions 2 (1997)
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Journal Article
Single Event Response of the Samsung 16G NAND Flash
Oldham, Timothy R., Wilcox, Edward P., Friendlich, Mark R.
Published in 2013 IEEE Radiation Effects Data Workshop (REDW) (01.07.2013)
Published in 2013 IEEE Radiation Effects Data Workshop (REDW) (01.07.2013)
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Conference Proceeding
Effect of Radiation Exposure on the Endurance of Commercial nand Flash Memory
Oldham, T.R., Friendlich, M., Carts, M.A., Seidleck, C.M., LaBel, K.A.
Published in IEEE transactions on nuclear science (01.12.2009)
Published in IEEE transactions on nuclear science (01.12.2009)
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Journal Article
Radiation Test Challenges for Scaled Commercial Memories
LaBel, K.A., Ladbury, R.L., Cohn, L.M., Oldham, T.R.
Published in IEEE transactions on nuclear science (01.08.2008)
Published in IEEE transactions on nuclear science (01.08.2008)
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Journal Article
Guest Editor’s Comments
Published in IEEE transactions on nuclear science
(01.12.1999)
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Journal Article
TID and SEE Response of Advanced Samsung and Micron 4G NAND Flash Memories for the NASA MMS Mission
Oldham, T.R., Friendlich, M.R., Sanders, A.B., Seidleck, C.M., Kim, H.S., Berg, M.D., LaBel, K.A.
Published in 2009 IEEE Radiation Effects Data Workshop (01.07.2009)
Published in 2009 IEEE Radiation Effects Data Workshop (01.07.2009)
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Conference Proceeding
Investigation of Current Spike Phenomena during Heavy Ion Irradiation of NAND Flash Memories
Oldham, Timothy R., Berg, M., Friendlich, M., Wilcox, T., Seidleck, C., LaBel, K. A., Irom, F., Buchner, S. P., McMorrow, D., Mavis, D. G., Eaton, P. H., Castillo, J.
Published in 2011 IEEE Radiation Effects Data Workshop (01.07.2011)
Published in 2011 IEEE Radiation Effects Data Workshop (01.07.2011)
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Conference Proceeding
Effects of heavy ion exposure on nanocrystal nonvolatile memory
Oldham, T.R., Suhail, M., Kuhn, P., Prinz, E., Kim, H.S., LaBel, K.A.
Published in IEEE transactions on nuclear science (01.12.2005)
Published in IEEE transactions on nuclear science (01.12.2005)
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Journal Article
Time dependence of switching oxide traps
Lelis, A.J., Oldham, T.R.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1994)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1994)
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Conference Proceeding