A 62-ns 16-Mb CMOS EPROM with voltage stress relaxation technique
Tomita, N., Ohtsuka, N., Miyamoto, J., Imamiya, K., Iyama, Y., Mori, S., Ohsima, Y., Arai, N., Kaneko, Y., Sakagami, E., Yoshikawa, K., Tanaka, S.
Published in IEEE journal of solid-state circuits (01.11.1991)
Published in IEEE journal of solid-state circuits (01.11.1991)
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Journal Article
A 68-ns 4-Mbit CMOS EPROM with high-noise-immunity design
Imamiya, K., Miyamoto, J., Atsumi, S., Ohtsuka, N., Muroya, Y., Sako, T., Higashino, M., Iyama, Y., Mori, S., Ohshima, Y., Araki, H., Kaneko, Y., Narita, K., Arai, N., Yoshikawa, K., Tanaka, S.
Published in IEEE journal of solid-state circuits (01.02.1990)
Published in IEEE journal of solid-state circuits (01.02.1990)
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Journal Article