Novel method to measure the refractive index and the absorption coefficient of organic nonlinear crystals in the ultra wideband THz region
Ohno, S., Miyamoto, K., Minamide, H., Ito, H.
Published in 2009 34th International Conference on Infrared, Millimeter, and Terahertz Waves (01.09.2009)
Published in 2009 34th International Conference on Infrared, Millimeter, and Terahertz Waves (01.09.2009)
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Conference Proceeding
The Dielectric Reliability of Very Thin SiO 2 Films Grown by Rapid Thermal Processing
Fukuda, Hisashi, Iwabuchi, Toshiyuki, Ohno, Seigo
Published in Japanese Journal of Applied Physics (01.11.1988)
Published in Japanese Journal of Applied Physics (01.11.1988)
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Journal Article
High-resolution Spectroscopy using a Ring-Cavity THz-Wave Parametric Oscillator and a Fabry-Perot Interferometer
Ohno, S., Ruixiang Guo, Minamide, H., Ito, H.
Published in 2007 Conference on Lasers and Electro-Optics - Pacific Rim (01.08.2007)
Published in 2007 Conference on Lasers and Electro-Optics - Pacific Rim (01.08.2007)
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Conference Proceeding
Improvement of crystallinity of epitaxial Si1-xGex films with SiH4 treatment in in-situ rapid thermal chemical vapor deposition
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Conference Proceeding
Journal Article
Polymerized phospholipid Langmuir-Blodgett multilayer films
Nakaya, Tadao, Yamada, Mitsuaki, Shibata, Kazunori, Imoto, Minoru, Tsuchiya, Hajime, Okuno, Mitsutoshi, Nakaya, Shigehisa, Ohno, Seigo, Matsuyama, Tomochika, Yamaoka, Hitoshi
Published in Langmuir (01.01.1990)
Published in Langmuir (01.01.1990)
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Journal Article
Formation of thick and narrow-spacing metal patterns by lift-off technique using negative photoresists, LMR and LMR-UV
Yamashita, Yoshio, Kawazu, Ryuji, Itoh, Toshio, Kawamura, Kazutami, Ohno, Seigo, Kobayashi, Kenji, Asano, Takateru, Nagamatsu, Gentaro
Published in Microelectronic engineering (01.12.1985)
Published in Microelectronic engineering (01.12.1985)
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Journal Article
Life of Magnetic Electroless Co-P Thin Films
Okamoto, Hideo, Nitta, Haruo, Ohno, Seigo
Published in IEEE transactions on reliability (01.12.1981)
Published in IEEE transactions on reliability (01.12.1981)
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Journal Article