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"OHMI, HIDEKAZU"
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"OHMI, HIDEKAZU"
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DEFECT CLASSIFICATION DEVICE AND DEFECT CLASSIFICATION METHOD
by
OHMI
,
Hidekazu
Year of Publication
15.08.2024
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DEFECT CLASSIFICATION DEVICE
by
OHMI
,
Hidekazu
Year of Publication
21.09.2023
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APPEARANCE INSPECTION DEVICE AND METHOD
by
OHMI
,
Hidekazu
Year of Publication
14.04.2022
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DICING-TIP INSPECTION APPARATUS
by
OHMI
,
Hidekazu
Year of Publication
09.01.2020
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EXTERNAL-APPEARANCE EXAMINATION DEVICE
by
INAO, Shota
,
OHMI
,
Hidekazu
Year of Publication
16.08.2018
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INSPECTION CONDITION DATA GENERATION METHOD AND INSPECTION SYSTEM OF SEMICONDUCTOR WAFER APPEARANCE INSPECTION APPARATUS
by
YAMAMOTO, HISASHI
,
OHMI
,
HIDEKAZU
Year of Publication
07.10.2010
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END FACE INSPECTION METHOD AND END FACE INSPECTION DEVICE
by
MATSUMURA, JUNICHI
,
OHMI
,
HIDEKAZU
,
TSUNEYOSHI, TAKESHI
Year of Publication
07.09.2012
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APPARATUS FOR OBSERVING EDGE OF SUBJECT TO BE OBSERVED AND APPARATUS FOR INSPECTING EDGE OF SUBJECT TO BE OBSERVED
by
OHMI
,
HIDEKAZU
,
TSUNEYOSHI, TAKESHI
,
TANIKAWA, HIROKI
Year of Publication
03.05.2012
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Defect classification device
by
OHMI
,
HIDEKAZU
Year of Publication
01.10.2023
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TWI815913B
by
OHMI
,
HIDEKAZU
Year of Publication
21.09.2023
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Appearance inspection device and method
by
OHMI
,
HIDEKAZU
Year of Publication
16.05.2022
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DICING-TIP INSPECTION APPARATUS
by
OHMI HIDEKAZU
Year of Publication
08.01.2021
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Dicing-tip inspection apparatus
by
OHMI
,
HIDEKAZU
Year of Publication
01.05.2020
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TWI755460B
by
OHMI
,
HIDEKAZU
,
INAO, SHOTA
Year of Publication
21.02.2022
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External-appearance examination device
by
OHMI
,
HIDEKAZU
,
INAO, SHOTA
Year of Publication
16.09.2018
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TWI402927B
by
YAMAMOTO, HISASHI
,
OHMI
,
HIDEKAZU
Year of Publication
21.07.2013
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Inspection condition data generation method and inspection system of semiconductor wafer appearance inspection apparatus
by
OHMI HIDEKAZU
,
YAMAMOTO HISASHI
Year of Publication
03.07.2013
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Inspection condition data generation method and inspection system of semiconductor wafer appearance inspection apparatus
by
OHMI HIDEKAZU
,
YAMAMOTO HISASHI
Year of Publication
08.02.2012
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Automatic appearance inspection device
by
OKUBO, KENJI
,
OHMI
,
HIDEKAZU
,
OKA, KOHEI
Year of Publication
16.08.2015
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Inspection condition data generation method and inspection system of semiconductor wafer appearance inspection apparatus
by
YAMAMOTO, HISASHI
,
OHMI
,
HIDEKAZU
Year of Publication
01.10.2010
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