Automotive 2.1 μm Full-Depth Deep Trench Isolation CMOS Image Sensor with a 120 dB Single-Exposure Dynamic Range
Yoo, Dongsuk, Jang, Youngtae, Kim, Youngchan, Shin, Jihun, Lee, Kangsun, Park, Seok-Yong, Shin, Seungho, Lee, Hongsuk, Kim, Seojoo, Park, Joongseok, Park, Cheonho, Lim, Moosup, Bae, Hyungjin, Park, Soeun, Jung, Minwook, Kim, Sungkwan, Choi, Shinyeol, Kim, Sejun, Heo, Jinkyeong, Lee, Hojoon, Lee, KyungChoon, Jeong, Youngkyun, Oh, Youngsun, Keel, Min-Sun, Kim, Bumsuk, Lee, Haechang, Ahn, JungChak
Published in Sensors (Basel, Switzerland) (01.11.2023)
Published in Sensors (Basel, Switzerland) (01.11.2023)
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Journal Article
A 1/2.8-inch 24Mpixel CMOS image sensor with 0.9μm unit pixels separated by full-depth deep-trench isolation
Yitae Kim, Wonchul Choi, Donghyuk Park, Heegeun Jeoung, Bumsuk Kim, Youngsun Oh, Sunghoon Oh, Byungjun Park, Euiyeol Kim, YunKi Lee, Taesub Jung, Yongwoon Kim, Sukki Yoon, Seokyong Hong, Jesuk Lee, Sangil Jung, Chang-Rok Moon, Yongin Park, Duckhyung Lee, Duckhyun Chang
Published in 2018 IEEE International Solid - State Circuits Conference - (ISSCC) (01.02.2018)
Published in 2018 IEEE International Solid - State Circuits Conference - (ISSCC) (01.02.2018)
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Conference Proceeding
A 1.2-Mpixel Indirect Time-of-Flight Image Sensor With 4-Tap 3.5-μm Pixels for Peak Current Mitigation and Multi-User Interference Cancellation
Keel, Min-Sun, Kim, Daeyun, Kim, Yeomyung, Bae, Myunghan, Ki, Myoungoh, Chung, Bumsik, Son, Sooho, Lee, Hoyong, Shin, Seung-Chul, Kye, Myeonggyun, An, Jaeil, Kwon, Yonghun, Seo, Sungyoung, Cho, Sunghyuck, Kim, Youngchan, Jin, Young-Gu, Oh, Youngsun, Kim, Yitae, Ahn, Jungchak, Lee, Jesuk
Published in IEEE journal of solid-state circuits (01.11.2021)
Published in IEEE journal of solid-state circuits (01.11.2021)
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Journal Article
AIMP3 Deletion Induces Acute Radiation Syndrome-like Phenotype in Mice
Kim, Doyeun, Kim, Sunmi, Oh, Youngsun, Park, Songhwa, Jeon, Yoon, Kim, Hongtae, Lee, Ho, Kim, Sunghoon
Published in Scientific reports (09.10.2018)
Published in Scientific reports (09.10.2018)
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Journal Article
A 1/1.33-inch 108Mpixel CMOS Image Sensor with 0.8um unit NONACELL pixels
Jung, Jaejin, Lim, Sinhwan, Kim, Jiyong, Yoo, Kwisung, Choi, Wontak, Oh, Youngsun, Ko, Juhyun, Koh, Kyoungmin
Published in 2022 IEEE International Symposium on Circuits and Systems (ISCAS) (28.05.2022)
Published in 2022 IEEE International Symposium on Circuits and Systems (ISCAS) (28.05.2022)
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Conference Proceeding
An Indirect Time-of-Flight CMOS Image Sensor Achieving Sub-ms Motion Lagging and 60fps Depth Image from On-chip ISP
Park, Jiheon, Kim, Daeyun, Lee, Hoyong, Shin, Seung-Chul, Ki, Myoungoh, Chung, Bumsik, Bae, Myunghan, Kye, Myeonggyun, Ahn, Jonghan, Song, Inho, Lee, Sunhwa, An, Jaeil, Hwang, Il-Pyeong, An, Taemin, Jin, Young-Gu, Kim, Youngchan, Oh, Youngsun, Ko, Juhyun, Lee, Haechang, Yim, JoonSeo
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
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Conference Proceeding
7.1 A 4-tap 3.5 μm 1.2 Mpixel Indirect Time-of-Flight CMOS Image Sensor with Peak Current Mitigation and Multi-User Interference Cancellation
Keel, Min-Sun, Kim, Daeyun, Kim, Yeomyung, Bae, Myunghan, Ki, Myoungoh, Chung, Bumsik, Son, Sooho, Lee, Hoyong, Jo, Heeyoung, Shin, Seung-Chul, Hong, Sunjoo, An, Jaeil, Kwon, Yonghun, Seo, Sungyoung, Cho, Sunghyuck, Kim, Youngchan, Jin, Young-Gu, Oh, Youngsun, Kim, Yitae, Ahn, JungChak, Koh, Kyoungmin, Park, Yongin
Published in 2021 IEEE International Solid- State Circuits Conference (ISSCC) (13.02.2021)
Published in 2021 IEEE International Solid- State Circuits Conference (ISSCC) (13.02.2021)
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Conference Proceeding
Sensitivity improvement in FSI CIS using the M1ToP™ smart process technique
Manlyun Ha, Sun Choi, DongHun Cho, Hosoo Kim, Jungyeon Cho, Youngsun Oh, Jongman Kim, Sangwon Yoon, Changhoon Choi, Juneseok Lee, Juil Lee, Joon Hwang
Published in 2012 International SoC Design Conference (ISOCC) (01.11.2012)
Published in 2012 International SoC Design Conference (ISOCC) (01.11.2012)
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Conference Proceeding
5.6 A 1/2.65in 44Mpixel CMOS Image Sensor with 0.7µm Pixels Fabricated in Advanced Full-Depth Deep-Trench Isolation Technology
Kim, HyunChul, Park, Jongeun, Joe, Insung, Kwon, Doowon, Kim, Joo Hyoung, Cho, Dongsuk, Lee, Taehun, Lee, Changkyu, Park, Haeyong, Hong, Soojin, Chang, Chongkwang, Kim, Jingyun, Lim, Hanjin, Oh, Youngsun, Kim, Yitae, Nah, Seungjoo, Jung, Sangill, Lee, Jaekyu, Ahn, JungChak, Hong, Hyeongsun, Lee, Kyupil, Kang, Ho-Kyu
Published in 2020 IEEE International Solid- State Circuits Conference - (ISSCC) (01.02.2020)
Published in 2020 IEEE International Solid- State Circuits Conference - (ISSCC) (01.02.2020)
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Conference Proceeding
A 0.8 μm Nonacell for 108 Megapixels CMOS Image Sensor with FD-Shared Dual Conversion Gain and 18,000e- Full-Well Capacitance
Oh, Youngsun, Kim, Munhwan, Choi, Wonchul, Choi, Hana, Jeon, Honghyun, Seok, Junho, Choi, Yujung, Jung, Jaejin, Yoo, Kwisung, Park, Donghyuk, Kim, Yitae, Koh, Kyung-min, Lee, Jesuk, Moon, Chang-Rok, Ahn, JungChak
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)
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Conference Proceeding
Image sensor and method of operating the same
Shin, Jongyoon, Kim, Munhwan, Jeon, Honghyun, Oh, Youngsun, Choi, Hana
Year of Publication 07.11.2023
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Year of Publication 07.11.2023
Patent
Advanced In-Line Monitoring BrightField Inspection Tool for E-Test Correlation and Yield Analysis on 45nm Test Chips
Kwon, YoungHun, Yoon, HakY, Kang, HoSeong, Kim, KiHo, Kim, Minho, Oh, YoungSun, Lee, JunWoo, Gunda, Vikram, Choi, HeungSoo, Shoji, Grant, Jung, Keebum, Choi, HyeongJu, Kim, JongPil, Ramani, Vijay, Kurada, Satya
Published in ECS transactions (23.11.2010)
Published in ECS transactions (23.11.2010)
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Journal Article
IMAGE SENSOR AND METHOD OF OPERATING THE SAME
Shin, Jongyoon, Kim, Munhwan, Jeon, Honghyun, Oh, Youngsun, Choi, Hana
Year of Publication 10.11.2022
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Year of Publication 10.11.2022
Patent
IMAGE SENSOR
Park, Junghoon, Lim, Moosup, Shin, Seungho, Bae, Hyungjin, Oh, Youngsun
Year of Publication 13.10.2022
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Year of Publication 13.10.2022
Patent
A 140 dB Single-Exposure Dynamic-Range CMOS Image Sensor with In-Pixel DRAM Capacitor
Oh, Youngsun, Lim, Jungwook, Park, Soeun, Yoo, Dongsuk, Lim, Moosup, Park, Joongseok, Kim, Seojoo, Jung, Minwook, Kim, Sungkwan, Lee, Junetaeg, Baek, In-Gyu, Ryu, Kwangyul, Kim, Kyungmin, Jang, Youngtae, Keel, Min-Sun, Bae, Gyujin, Yoo, Seunghun, Jeong, Youngkyun, Kim, Bumsuk, Ahn, Jungchak, Lee, Haechang, Yim, Joonseo
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)
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Conference Proceeding