Effects of Fluorine on the NBTI Reliability and Low-Frequency Noise Characteristics of p-MOSFETs
Kwon, Sung-Kyu, Kwon, Hyuk-Min, Han, In-Shik, Jang, Jae-Hyung, Oh, Sun-Ho, Song, Hyeong-Sub, Park, Byoung-Seok, Chung, Yi-Sun, Lee, Jung-Hwan, Kim, Si-Bum, Lee, Ga-Won, Lee, Hi-Deok
Published in IEEE journal of the Electron Devices Society (01.01.2018)
Published in IEEE journal of the Electron Devices Society (01.01.2018)
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Journal Article
A Correlation Between Oxygen Vacancies and Reliability Characteristics in a Single Zirconium Oxide Metal-Insulator-Metal Capacitor
Hyuk-Min Kwon, Sung-Kyu Kwon, Kwang-Seok Jeong, Sung-Kwen Oh, Sun-Ho Oh, Woon-Il Choi, Tae-Woo Kim, Dae-Hyun Kim, Chang-Yong Kang, Byoung Hun Lee, Kirsch, Paul, Hi-Deok Lee
Published in IEEE transactions on electron devices (01.08.2014)
Published in IEEE transactions on electron devices (01.08.2014)
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Journal Article
Identification of Interface States and Shallow and Deep Hole Traps under NBTI Stress using Fast, Normal, and Charge-pumping Measurement Techniques
Kwon, Sung-Kyu, Oh, Sun-Ho, Song, Hyeong-Sub, Kim, So-Yeong, Lee, Ga-Won, Lee, Hi-Deok
Published in Journal of semiconductor technology and science (01.04.2018)
Published in Journal of semiconductor technology and science (01.04.2018)
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Journal Article
Effect of fluorine implantation on recovery characteristics of p-channel MOSFET after negative bias temperature instability stress
Oh, Sun-Ho, Kwon, Hyuk-Min, Kwon, Sung-Kyu, Sung, Seung-Yong, Yu, Jae-Nam, Lee, Ga-Won, Lee, Hi-Deok
Published in Japanese Journal of Applied Physics (01.08.2014)
Published in Japanese Journal of Applied Physics (01.08.2014)
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Journal Article
Decrease of Parasitic Capacitance for Improvement of RF Performance of Multi-finger MOSFETs in 90-nm CMOS Technology
Jang, Seong-Yong, Kwon, Sung-Kyu, Shin, Jong-Kwan, Yu, Jae-Nam, Oh, Sun-Ho, Jeong, Jin-Woong, Song, Hyeong-Sub, Kim, Choul-Young, Lee, Ga-Won, Lee, Hi-Deok
Published in Journal of semiconductor technology and science (01.04.2015)
Published in Journal of semiconductor technology and science (01.04.2015)
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Journal Article
Decrease of Parasitic Capacitance for Improvement of RF Performance of Multi-finger MOSFETs in 90-nm CMOS Technology
Jang, Seong-Yong, Kwon, Sung-Kyu, Shin, Jong-Kwan, Yu, Jae-Nam, Oh, Sun-Ho, Jeong, Jin-Woong, Song, Hyeong-Sub, Kim, Choul-Young, Lee, Ga-Won, Lee, Hi-Deok
Published in Journal of semiconductor technology and science (2015)
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Published in Journal of semiconductor technology and science (2015)
Journal Article
Modeling of T-model equivalent circuit for spiral inductors in 90 nm CMOS technology
Jeong, Jin-Woong, Kwon, Sung-Kyu, Yu, Jae-Nam, Jang, Seong-Yong, Oh, Sun-Ho, Kim, Choul-Young, Lee, Ga-won, Lee, Hi-Deok
Published in Proceedings of the 2015 International Conference on Microelectronic Test Structures (01.03.2015)
Published in Proceedings of the 2015 International Conference on Microelectronic Test Structures (01.03.2015)
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Conference Proceeding
Journal Article
Osseointegration with Ceramic Coated Implant
Ko, Jin Hyuk, Kwon, Soon, Ahn, Myun Whan, Choi, Jun Hyeok, Kim, Suk Young, Oh, Sun Ho
Published in Taehan Chŏ'kch'u Oekwa Hakhoe chi (2004)
Published in Taehan Chŏ'kch'u Oekwa Hakhoe chi (2004)
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Journal Article