Search Results - "OH, Heungsuk" :: K.UTB vyhledávací portál

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Method of verifying error of optical proximity correction model

by Oh, Heungsuk, Park, Sangwook, Kang, Mincheol
Year of Publication 11.07.2023

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METHOD OF VERIFYING ERROR OF OPTICAL PROXIMITY CORRECTION MODEL

by Oh, Heungsuk, Park, Sangwook, Kang, Mincheol
Year of Publication 09.06.2022

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Patent

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METHOD OF FABRICATING SEMICONDUCTOR DEVICE

by KIM, Sangwook, HAN, Kyu-Bin, OH, Heungsuk
Year of Publication 08.06.2023

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Patent

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OPTICAL PROXIMITY CORRECTION METHOD AND PHOTOMASK FABRICATION METHOD USING THE SAME

by LEE, HEE-JUN, JUNG, JEEEUN, KIM, SANGWOOK, OH, HEUNGSUK, KIM, Joobyoung, HAN, KYU-BIN
Year of Publication 30.05.2024

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Method for manufacturing semiconductor device

by HAN KYU BIN, KIM SANGWOOK, OH HEUNGSUK
Year of Publication 16.06.2023

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OPC Method for OPC and method for manufacturing semiconductor device using the same

by KIM JOOBYOUNG, HAN KYU BIN, KIM SANGWOOK, JUNG JEEEUN, OH HEUNGSUK, LEE HEE JUN
Year of Publication 05.06.2024

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METHOD FOR OPTICAL PROXIMITY CORRECTION IN WHICH CONSISTENCY IS MAINTAIN AND METHOD FOR MANUFACTURING MASK USING THE SAME

by KIM JOOBYOUNG, KIM SANGHUN, KIM GUK HYUN, OH HEUNGSUK
Year of Publication 26.04.2021

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Patent

Method of verifying error of optical proximity correction model

METHOD OF VERIFYING ERROR OF OPTICAL PROXIMITY CORRECTION MODEL

METHOD OF FABRICATING SEMICONDUCTOR DEVICE

OPTICAL PROXIMITY CORRECTION METHOD AND PHOTOMASK FABRICATION METHOD USING THE SAME

Method for manufacturing semiconductor device

OPC Method for OPC and method for manufacturing semiconductor device using the same

METHOD FOR OPTICAL PROXIMITY CORRECTION IN WHICH CONSISTENCY IS MAINTAIN AND METHOD FOR MANUFACTURING MASK USING THE SAME

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