METHODS FOR MEASUREMENT
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Year of Publication 17.12.2020
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Year of Publication 17.12.2020
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Adaptive wavefront aberration correction in a free-space fiber-optic system based only on the received power
Sinefeld, David, Ella, Roy, Zaharan, Ofer, Valiano, Yuval, Mach, Eliezer, Marom, Dan M.
Published in CLEO: 2011 - Laser Science to Photonic Applications (01.05.2011)
Published in CLEO: 2011 - Laser Science to Photonic Applications (01.05.2011)
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Decreasing inaccuracy due to non-periodic effects on scatterometric signals
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Year of Publication 26.12.2017
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Year of Publication 26.12.2017
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Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology
Yaziv, Tal, Ashwal, Eltsafon, Gurevich, Evgeni, Sella, Noga, Manassen, Amnon, Bringoltz, Barak, Sulimarski, Roee, Amir, Nuriel, Handelman, Amir, Saltoun, Lilach, Zhao, Zeng, Zaharan, Ofer, Carmel, Nadav, Cooper, Moshe, Leviant, Tom, Marciano, Tal, Lindenfeld, Ze'ev, Kandel, Daniel, Bachar, Ohad, Feler, Yoel, Adam, Ido, Kaminsky, Oded, Efraty, Boris
Year of Publication 10.11.2020
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Year of Publication 10.11.2020
Patent
Wavefront aberration correction in a free-space optical communication link using only the fiber-coupled optical power as a feedback mechanism
Sinefeld, David, Ella, Roy, Zaharan, Ofer, Valiano, Yuval, Mach, Eliezer, Marom, Dan M
Published in 2010 IEEE 26-th Convention of Electrical and Electronics Engineers in Israel (01.11.2010)
Published in 2010 IEEE 26-th Convention of Electrical and Electronics Engineers in Israel (01.11.2010)
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Conference Proceeding
ANALYZING AND UTILIZING LANDSCAPES
MARCIANO, Tal, COOPER, Moshe, SULIMARSKI, Roee, FELER, Yoel, ZHAO, Zeng, BACHAR, Ohad, CARMEL, Nadav, ADAM, Ido, SELLA, Noga, ASHWAL, Eltsafon, LINDENFELD, Za'ev, EFRATY, Boris, KANDEL, Daniel, BRINGOLTZ, Barak, ZAHARAN, Ofer, SALTOUN, Lilach, GUREVICH, Evgeni, LEVIANT, Tom, HANDELMAN, Amir, KAMINSKY, Oded, YAZIV, Tal, AMIR, Nuriel, MANASSEN, Amnon
Year of Publication 29.06.2017
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Year of Publication 29.06.2017
Patent
Overlay metrology by pupil phase analysis
ZAHARAN OFER, MANASSEN AMNON, LEVINSKI VLADIMIR, NEGRI DARIA, SELIGSON JOEL, SAPIENS NOAM, HILL ANDY, KANDEL DANIEL, BACHAR OHAD, BARUCH MOSHE
Year of Publication 12.11.2013
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Year of Publication 12.11.2013
Patent
OVERLAY METROLOGY BY PUPIL PHASE ANALYSIS
LEVINSKI, VLADIMIR, HILL, ANDY, MANASSEN, AMNON, KANDEL, DANIEL, SELIGSON, JOEL L, SAPIENS, NOAM, BACHAR, OHAD, ZAHARAN, OFER, NEGRI, DARIA, BARUCH, MOSHE
Year of Publication 24.12.2014
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Year of Publication 24.12.2014
Patent
METHOD OF OPTICAL METROLOGY, COMPUTER PROGRAM PRODUCT, METROLOGY MODULE, TARGET DESIGN FILE, LANDSCAPE AND METROLOGY MEASUREMENTS OF TARGETS
HANDELMAN, AMIR, BRINGOLTZ, BARAK, LEVIANT, TOM, ZAHARAN, OFER, YAZIV, TAL, COOPER, MOSHE, SULIMARSKI, ROEE, GUREVICH, EVGENI, ADAM, IDO, MARCIANO, TAL, BACHAR, OHAD, CARMEL, NADAV, SALTOUN, LILACH, EFRATY, BORIS, SELLA, NOGA, FELER, YOEL, ASHWAL, ELTSAFON
Year of Publication 21.02.2021
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Year of Publication 21.02.2021
Patent
METHODS OF ANALYZING AND UTILIZING LANDSCAPES TO REDUCE OR ELIMINATE INACCURACY IN OVERLAY OPTICAL METROLOGY
Kaminsky Oded, Cooper Moshe, Adam Ido, Zaharan Ofer, Yaziv Tal, Sella Noga, Zhao Zeng, Manassen Amnon, Saltoun Lilach, Feler Yoel, Bringoltz Barak, Marciano Tal, Lindenfeld Ze'ev, Carmel Nadav, Leviant Tom, Handelman Amir, Ashwal Eltsafon, Sulimarski Roee, Gurevich Evgeni, Kandel Daniel, Amir Nuriel, Efraty Boris, Bachar Ohad
Year of Publication 27.10.2016
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Year of Publication 27.10.2016
Patent
Method of optical metrology, computer program product, and metrology module
HANDELMAN, AMIR, BRINGOLTZ, BARAK, LEVIANT, TOM, ZAHARAN, OFER, YAZIV, TAL, COOPER, MOSHE, SULIMARSKI, ROEE, GUREVICH, EVGENI, ADAM, IDO, MARCIANO, TAL, BACHAR, OHAD, CARMEL, NADAV, SALTOUN, LILACH, EFRATY, BORIS, SELLA, NOGA, FELER, YOEL, ASHWAL, ELTSAFON
Year of Publication 21.11.2020
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Year of Publication 21.11.2020
Patent
OVERLAY METROLOGY BY PUPIL PHASE ANALYSIS
LEVINSKI, VLADIMIR, HILL, ANDY, MANASSEN, AMNON, KANDEL, DANIEL, SELIGSON, JOEL L, SAPIENS, NOAM, BACHAR, OHAD, ZAHARAN, OFER, NEGRI, DARIA, BARUCH, MOSHE
Year of Publication 25.06.2014
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Year of Publication 25.06.2014
Patent
OVERLAY METROLOGY BY PUPIL PHASE ANALYSIS
ZAHARAN OFER, MANASSEN AMNON, LEVINSKI VLADIMIR, NEGRI DARIA, SELIGSON JOEL, SAPIENS NOAM, HILL ANDY, KANDEL DANIEL, BACHAR OHAD, BARUCH MOSHE
Year of Publication 21.02.2013
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Year of Publication 21.02.2013
Patent
ANALYZING AND UTILIZING LANDSCAPES
KANDEL, DANIEL, MANASSEN, AMNON, HANDELMAN, AMIR, AMIR, NURIEL, BRINGOLTZ, BARAK, LEVIANT, TOM, ZAHARAN, OFER, LINDENFELD, ZA'EV, YAZIV, TAL, COOPER, MOSHE, SULIMARSKI, ROEE, GUREVICH, EVGENI, ZHAO, ZENG, KAMINSKY, ODED, ADAM, IDO, MARCIANO, TAL, BACHAR, OHAD, CARMEL, NADAV, SALTOUN, LILACH, EFRATY, BORIS, SELLA, NOGA, FELER, YOEL, ASHWAL, ELTSAFON
Year of Publication 02.06.2016
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Year of Publication 02.06.2016
Patent
Method of optical metrology, computer program product, metrology module, target design file, landscape and metrology measurements of targets
HANDELMAN, AMIR, BRINGOLTZ, BARAK, LEVIANT, TOM, ZAHARAN, OFER, YAZIV, TAL, COOPER, MOSHE, SULIMARSKI, ROEE, GUREVICH, EVGENI, ADAM, IDO, MARCIANO, TAL, BACHAR, OHAD, CARMEL, NADAV, SALTOUN, LILACH, EFRATY, BORIS, SELLA, NOGA, FELER, YOEL, ASHWAL, ELTSAFON
Year of Publication 16.05.2020
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Year of Publication 16.05.2020
Patent
Analyzing and utilizing landscapes
BRINGOLTZ BARAK, SULIMARSKI ROEE, HANDELMAN AMIR, MANASSEN AMNON, ZA'EV LINDENFELD, KAMINSKY ODED, YAZIV TAL, EFRATY BORIS, ASHWAL ELTSAFON, FELER YOEL, KANDEL DANIEL, BACHAR OHAD, COOPER MOSHE, ZAHARAN OFER, LEVIANT TOM, SELLA NOGA, ZHAO ZHUANGTIAN, ADAM IDO, AMIR NURIEL, GUREVICH EVGENI, SALTOUN LILACH, MARCIANO TAL, CARMEL NADAV
Year of Publication 23.04.2021
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Year of Publication 23.04.2021
Patent
OVERLAY METROLOGY BY PUPIL PHASE ANALYSIS
LEVINSKI, VLADIMIR, HILL, ANDY, MANASSEN, AMNON, KANDEL, DANIEL, SELIGSON, JOEL L, SAPIENS, NOAM, BACHAR, OHAD, ZAHARAN, OFER, NEGRI, DARIA, BARUCH, MOSHE
Year of Publication 21.02.2013
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Year of Publication 21.02.2013
Patent
Method and system for measuring overlay utilizing pupil phase information
HILL, ANDY, LEVINSKI, VLADIMIR, MANASSEN, AMNON, KANDEL, DANIEL, SAPIENS, NOAM, BACHAR, OHAD, ZAHARAN, OFER, NEGRI, DARIA, SELIGSON, JOEL, BARUCH, MOSHE
Year of Publication 01.01.2017
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Year of Publication 01.01.2017
Patent
Analyzing and utilizing landscapes
HANDELMAN, AMIR, BRINGOLTZ, BARAK, LEVIANT, TOM, ZAHARAN, OFER, YAZIV, TAL, COOPER, MOSHE, SULIMARSKI, ROEE, GUREVICH, EVGENI, ADAM, IDO, MARCIANO, TAL, BACHAR, OHAD, CARMEL, NADAV, SALTOUN, LILACH, EFRATY, BORIS, SELLA, NOGA, FELER, YOEL, ASHWAL, ELTSAFON
Year of Publication 16.09.2016
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Year of Publication 16.09.2016
Patent
Analyzing and utilizing landscapes
BRINGOLTZ BARAK, SULIMARSKI ROEE, HANDELMAN AMIR, MANASSEN AMNON, KAMINSKY ODED, YAZIV TAL, EFRATY BORIS, ASHWAL ELTSAFON, FELER YOEL, KANDEL DANIEL, BACHAR OHAD, LINDENFELD ZA EV, COOPER MOSHE, ZAHARAN OFER, LEVIANT TOM, SELLA NOGA, ZHAO ZENG, ADAM IDO, AMIR NURIEL, GUREVICH EVGENI, SALTOUN LILACH, MARCIANO TAL, CARMEL NADAV
Year of Publication 18.08.2017
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Year of Publication 18.08.2017
Patent