Estimation of fixed charge densities in hafnium-silicate gate dielectrics
Kaushik, V.S., O'Sullivan, B.J., Pourtois, G., Van Hoornick, N., Delabie, A., Van Elshocht, S., Deweerd, W., Schram, T., Pantisano, L., Rohr, E., Ragnarsson, L.-A., De Gendt, S., Heyns, M.
Published in IEEE transactions on electron devices (01.10.2006)
Published in IEEE transactions on electron devices (01.10.2006)
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Journal Article
Nanocrystalline TiO2 films studied by optical, XRD and FTIR spectroscopy
Zhang, Jun-Ying, Boyd, Ian W., O'Sullivan, B.J., Hurley, P.K., Kelly, P.V., Sénateur, J.-P.
Published in Journal of non-crystalline solids (01.05.2002)
Published in Journal of non-crystalline solids (01.05.2002)
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Journal Article
Conference Proceeding
Interface of ultrathin HfO2 films deposited by UV-photo-CVD
Fang, Q., Zhang, J.-Y., Wang, Z., Modreanu, M., O'Sullivan, B.J., Hurley, P.K., Leedham, T.L., Hywel, D., Audier, M.A., Jimenez, C., Senateur, J.-P., Boyd, Ian W
Published in Thin solid films (01.04.2004)
Published in Thin solid films (01.04.2004)
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Journal Article
Effectiveness of Nitridation of Hafnium Silicate Dielectrics: A Comparison Between Thermal and Plasma Nitridation
O'Sullivan, B.J., Kaushik, V.S., Everaert, J.-L., Trojman, L., Ragnarsson, L.-A., Pantisano, L., Rohr, E., DeGendt, S., Heyns, M.
Published in IEEE transactions on electron devices (01.07.2007)
Published in IEEE transactions on electron devices (01.07.2007)
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Journal Article
Work-Function Engineering for 32-nm-Node pMOS Devices: High-Performance TaCNO-Gated Films
O'Sullivan, B.J., Mitsuhashi, R., Ito, S., Oikawa, K., Kubicek, S., Paraschiv, V., Adelmann, C., Veloso, A., HongYu Yu, Schram, T., Biesemans, S., Nakabayashi, T., Ikeda, A., Niwa, M.
Published in IEEE electron device letters (01.11.2008)
Published in IEEE electron device letters (01.11.2008)
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Journal Article
Accurate Gate Impedance Determination on Ultraleaky MOSFETs by Fitting to a Three-Lumped-Parameter Model atFrequencies From DC to RF
San Andres, E., Pantisano, L., Ramos, J., Roussel, P.J., O'Sullivan, B.J., Toledano-Luque, M., DeGendt, S., Groeseneken, G.
Published in IEEE transactions on electron devices (01.07.2007)
Published in IEEE transactions on electron devices (01.07.2007)
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Journal Article
STT-MRAM array performance improvement through optimization of Ion Beam Etch and MTJ for Last-Level Cache application
Rao, S., Kim, W., van Beek, S., Kundu, S., Perumkunnil, M., Cosemans, S., Yasin, F., Couet, S., Carpenter, R., O'Sullivan, B.J., Sharifi, S. H., Jossart, N., Souriau, L., Goux, L., Crotti, D., Kar, G. S.
Published in 2021 IEEE International Memory Workshop (IMW) (01.05.2021)
Published in 2021 IEEE International Memory Workshop (IMW) (01.05.2021)
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Conference Proceeding
Deep electron traps in HfO2-based ferroelectrics: (Al/Si-doped) HfO2 versus HfZrO4
Izmailov, R.A., O'Sullivan, B.J., Popovici, M.I., Afanas'ev, V.V.
Published in Solid-state electronics (01.08.2022)
Published in Solid-state electronics (01.08.2022)
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Journal Article
When should we test for voltage-gated potassium channel complex antibodies? A retrospective case control study
O’Sullivan, B.J, Steele, T, Ellul, M.A, Kirby, E, Duale, A, Kier, G, Crooks, D, Jacob, A, Solomon, T, Michael, B.D
Published in Journal of clinical neuroscience (01.11.2016)
Published in Journal of clinical neuroscience (01.11.2016)
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Journal Article
Electron trapping in ferroelectric HfZrO4 and Al- and Si-doped layers
Izmailov, R.A., O'Sullivan, B.J., Popovici, M., Afanas'ev, V.V.
Published in Solid-state electronics (01.09.2021)
Published in Solid-state electronics (01.09.2021)
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Journal Article
Shallow electron traps in high-k insulating oxides
Izmailov, R.A., O'Sullivan, B.J., Popovici, M., Kittl, J.A., Afanas'ev, V.V.
Published in Solid-state electronics (01.09.2021)
Published in Solid-state electronics (01.09.2021)
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Journal Article
(507) - Accumulation of Intragraft CD15s+Tregs in Long-term Lung Transplant Survivors
O'Sullivan, B.J., Hopkins, P., Trotter, M., Fiene, A., Tan, M., Sinclair, K., Chambers, D.
Published in The Journal of heart and lung transplantation (01.04.2018)
Published in The Journal of heart and lung transplantation (01.04.2018)
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Journal Article
(79) - Lysophosphatidic Acid Drives Recruitment and Fibroblastic Differentiation of Mesenchymal Stromal Cells in Chronic Lung Allograft Dysfunction
Sinclair, K.A., Tan, M.E., Sladden, T.M., Hopkins, P.M., O'Sullivan, B.J., Chambers, D.C.
Published in The Journal of heart and lung transplantation (01.04.2018)
Published in The Journal of heart and lung transplantation (01.04.2018)
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Journal Article
Electrical characterization of HfO2 films obtained by UV assisted injection MOCVD
DECAMS, J. M, GUILLON, H, RUSWORTH, S, LEEDHAM, T. J, DAVIES, H, FANG, Q, BOYD, I, JIMENEZ, C, AUDIER, M, SENATEUR, J. P, DUBOURDIEU, C, CADIX, O, O'SULLIVAN, B. J, MODREANU, M, HURLEY, P. K
Published in Microelectronics and reliability (01.05.2005)
Published in Microelectronics and reliability (01.05.2005)
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Conference Proceeding
Journal Article
Flat band voltage shift and oxide properties after rapid thermal annealing
O'Sullivan, B.J., Hurley, P.K., Cubaynes, F.N., Stolk, P.A., Widdershoven, F.P.
Published in Microelectronics and reliability (01.07.2001)
Published in Microelectronics and reliability (01.07.2001)
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Journal Article
Process simplification for 15.6×15.6 cm2 interdigitated back contact silicon solar cells by laser doping
Zieliński, B., O'Sullivan, B.J., Singh, S., Urueña de Castro, A., Li, Y., Jambaldinni, S., Debucquoy, M., Mertens, R., Poortmans, J.
Published in Solar energy materials and solar cells (01.04.2017)
Published in Solar energy materials and solar cells (01.04.2017)
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Journal Article
Passivation of a Metal Contact with a Tunneling Layer
Loozen, X., Larsen, J.B., Dross, F., Aleman, M., Bearda, T., O'Sullivan, B.J., Gordon, I., Poortmans, J.
Published in Energy procedia (2012)
Published in Energy procedia (2012)
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Journal Article
Gate-Stack Engineered NBTI Improvements in Highvoltage Logic-For-Memory High-ĸ/Metal Gate Devices
O'Sullivan, B.J., Ritzenthaler, R., Rzepa, G., Wu, Z., Litta, E. Dentoni, Richard, O., Conard, T., Machkaoutsan, V., Fazan, P., Kim, C., Franco, J., Kaczer, B., Grasser, T., Spessot, A., Linten, D, Horiguchi, N.
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
High-[kappa] Metal Gate MOSFETs: Impact of Extrinsic Process Condition on the Gate-Stack Quality--A Mobility Study
Trojman, L, Ragnarsson, L.-A, O'Sullivan, B.J, Rosmeulen, M, Kaushik, V.S, Groeseneken, G.V, Maes, H.E, De Gendt, S, Heyns, M
Published in IEEE transactions on electron devices (01.03.2007)
Published in IEEE transactions on electron devices (01.03.2007)
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Journal Article