Effect of deposition conditions and post deposition anneal on reactively sputtered titanium nitride thin films
Ponon, Nikhil K., Appleby, Daniel J.R., Arac, Erhan, King, P.J., Ganti, Srinivas, Kwa, Kelvin S.K., O'Neill, Anthony
Published in Thin solid films (02.03.2015)
Published in Thin solid films (02.03.2015)
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Journal Article
Genome-wide association identifies a common variant in the reelin gene that increases the risk of schizophrenia only in women
Shifman, Sagiv, Johannesson, Martina, Bronstein, Michal, Chen, Sam X, Collier, David A, Craddock, Nicholas J, Kendler, Kenneth S, Li, Tao, O'Donovan, Michael, O'Neill, F Anthony, Owen, Michael J, Walsh, Dermot, Weinberger, Daniel R, Sun, Cuie, Flint, Jonathan, Darvasi, Ariel
Published in PLoS genetics (01.02.2008)
Published in PLoS genetics (01.02.2008)
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Journal Article
Local solid phase growth of few-layer graphene on silicon carbide from nickel silicide supersaturated with carbon
Escobedo-Cousin, Enrique, Vassilevski, Konstantin, Hopf, Toby, Wright, Nick, O'Neill, Anthony, Horsfall, Alton, Goss, Jonathan, Cumpson, Peter
Published in Journal of applied physics (21.03.2013)
Published in Journal of applied physics (21.03.2013)
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Journal Article
Optogenetic Multiphysical Fields Coupling Model for Implantable Neuroprosthetic Probes
Dong, Na, Johnson, Emily, Berlinguer-Palmini, Rolando, Zhong, Hongze, Dehkhoda, Fahimeh, Soltan, Ahmed, Nikolic, Konstantin, Grossman, Nir, Gausden, Johannes, Bailey, Richard, O'Neill, Anthony, Jackson, Andrew, Trevelyan, Andrew, Degenaar, Patrick, Sun, Xiaohan
Published in IEEE access (2024)
Published in IEEE access (2024)
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Journal Article
Ferroelectric properties in thin film barium titanate grown using pulsed laser deposition
Appleby, Daniel J. R., Ponon, Nikhil K., Kwa, Kelvin S. K., Ganti, Srinivas, Hannemann, Ullrich, Petrov, Peter K., Alford, Neil M., O'Neill, Anthony
Published in Journal of applied physics (28.09.2014)
Published in Journal of applied physics (28.09.2014)
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Journal Article
A Closed-Loop Optogenetic Platform
Firfilionis, Dimitrios, Hutchings, Frances, Tamadoni, Reza, Walsh, Darren, Turnbull, Mark, Escobedo-Cousin, Enrique, Bailey, Richard G, Gausden, Johannes, Patel, Aaliyah, Haci, Dorian, Liu, Yan, LeBeau, Fiona E N, Trevelyan, Andrew, Constandinou, Timothy G, O'Neill, Anthony, Kaiser, Marcus, Degenaar, Patrick, Jackson, Andrew
Published in Frontiers in neuroscience (10.09.2021)
Published in Frontiers in neuroscience (10.09.2021)
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Journal Article
High-Mobility SiC MOSFETs Using a Thin-SiO2/Al2O3 Gate Stack
Urresti, Jesus, Vassilevski, Konstantin, Tiwari, Amit Kumar, O'Neill, Anthony G., Arith, Faiz, Wright, Nick G., Olsen, Sarah
Published in Materials science forum (05.06.2018)
Published in Materials science forum (05.06.2018)
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Journal Article
Dynamic changes of functional segregation and integration in vulnerability and resilience to schizophrenia
Duan, Jia, Xia, Mingrui, Womer, Fay Y., Chang, Miao, Yin, Zhiyang, Zhou, Qian, Zhu, Yue, Liu, Zhuang, Jiang, Xiaowei, Wei, Shengnan, Anthony O'Neill, Francis, He, Yong, Tang, Yanqing, Wang, Fei
Published in Human brain mapping (01.05.2019)
Published in Human brain mapping (01.05.2019)
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Journal Article
Occurrence and co-occurrence of hallucinations by modality in schizophrenia-spectrum disorders
McCarthy-Jones, Simon, Smailes, David, Corvin, Aiden, Gill, Michael, Morris, Derek W, Dinan, Timothy G, Murphy, Kieran C, Anthony O’Neill, F, Waddington, John L, Australian Schizophrenia Research Bank, Donohoe, Gary, Dudley, Robert
Published in Psychiatry research (01.06.2017)
Published in Psychiatry research (01.06.2017)
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Journal Article
Electrical Characterization of Epitaxial Graphene Field-Effect Transistors with High-k Al2O3 Gate Dielectric Fabricated on SiC Substrates
Wright, Nicholas G., Goss, Jonathan, Escobedo-Cousin, Enrique, Horsfall, Alton B., Hunt, Michael, Vassilevski, Konstantin, ONeill, Anthony, Wells, George, Hopf, Toby, King, Peter
Published in Materials science forum (30.06.2015)
Published in Materials science forum (30.06.2015)
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Journal Article
Apoptotic engulfment pathway and schizophrenia
Chen, Xiangning, Sun, Cuie, Chen, Qi, O'Neill, F Anthony, Walsh, Dermot, Fanous, Ayman H, Chowdari, Kodavali V, Nimgaonkar, Vishwajit L, Scott, Adrian, Schwab, Sibylle G, Wildenauer, Dieter B, Che, Ronglin, Tang, Wei, Shi, Yongyong, He, Lin, Luo, Xiong-Jian, Su, Bing, Edwards, Todd L, Zhao, Zhongming, Kendler, Kenneth S
Published in PloS one (01.09.2009)
Published in PloS one (01.09.2009)
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Journal Article
Analysis of Self-Heating Effects in Ultrathin-Body SOI MOSFETs by Device Simulation
Fiegna, C., Yang Yang, Sangiorgi, E., O'Neill, A.G.
Published in IEEE transactions on electron devices (01.01.2008)
Published in IEEE transactions on electron devices (01.01.2008)
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Journal Article
In situ X-ray diffraction study of self-forming barriers from a Cu–Mn alloy in 100 nm Cu/low- k damascene interconnects using synchrotron radiation
Wilson, Christopher J., Volders, Henny, Croes, Kristof, Pantouvaki, Marianna, Beyer, Gerald P., Horsfall, Alton B., O’Neill, Anthony G., Tőkei, Zsolt
Published in Microelectronic engineering (01.03.2010)
Published in Microelectronic engineering (01.03.2010)
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Journal Article
Conference Proceeding
Experimental Observation of Negative Capacitance in Ferroelectrics at Room Temperature
Appleby, Daniel J. R, Ponon, Nikhil K, Kwa, Kelvin S. K, Zou, Bin, Petrov, Peter K, Wang, Tianle, Alford, Neil M, O’Neill, Anthony
Published in Nano letters (09.07.2014)
Published in Nano letters (09.07.2014)
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Journal Article
Impact of strained-Si thickness and Ge out-diffusion on gate oxide quality for strained-Si surface channel n-MOSFETs
Dalapati, G.K., Chattopadhyay, S., Kwa, K.S.K., Olsen, S.H., Tsang, Y.L., Agaiby, R., O'Neill, A.G., Dobrosz, P., Bull, S.J.
Published in IEEE transactions on electron devices (01.05.2006)
Published in IEEE transactions on electron devices (01.05.2006)
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Journal Article
Quantifying self-heating effects with scaling in globally strained Si MOSFETs
Agaiby, Rimoon, Yang, Yang, Olsen, Sarah H., O’Neill, Anthony G., Eneman, Geert, Verheyen, Peter, Loo, Roger, Claeys, Cor
Published in Solid-state electronics (01.11.2007)
Published in Solid-state electronics (01.11.2007)
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Journal Article
Conference Proceeding