Optical Modulator P/N Junction Mapping by Electron Holography and Scanning Capacitance Microscopy
Wang, Y. Y., Nxumalo, J., Jeon, J., Barton, K., Nummy, K.
Published in Microscopy and microanalysis (01.08.2018)
Published in Microscopy and microanalysis (01.08.2018)
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Journal Article
Dysphagia lusoria--report of 2 cases and a review of the literature
Ntlhe, L M, Koto, Z, Mokotedi, S D, Nxumalo, J
Published in South African journal of surgery (01.11.2006)
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Published in South African journal of surgery (01.11.2006)
Journal Article
2D Junction Profiling on Semiconductor Device Reliability Fail
Wang, Y.Y., Nxumalo, J., Katnani, A., Ioannou, D., Brown, J., Bandy, K., Macdonald, M., Bruley, J.
Published in Microscopy and microanalysis (01.07.2017)
Published in Microscopy and microanalysis (01.07.2017)
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Journal Article
High-resolution cross-sectional imaging of MOSFETs by scanning resistance microscopy
Nxumalo, J.N., Shimizu, D.T., Thomson, D.J., Simard-Normadin, M.
Published in IEEE electron device letters (01.02.1997)
Published in IEEE electron device letters (01.02.1997)
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Journal Article
Dysphagia lusoria - report of 2 cases and a review of the literature : case report
Koto, Z., Ntlhe, L.M., Mokotedi, S.D., Nxumalo, J.
Published in South African journal of surgery (01.11.2006)
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Published in South African journal of surgery (01.11.2006)
Journal Article
2D carrier profiles by SSRM and TCAD for root cause analysis of low Vt PFET
Nxumalo, J. N., Wang, Y. Y., Krishnasamy, R., Katnani, A.
Published in 2017 17th International Workshop on Junction Technology (IWJT) (01.06.2017)
Published in 2017 17th International Workshop on Junction Technology (IWJT) (01.06.2017)
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Conference Proceeding
Evaluation of emitter profiles and lateral uniformity on crystalline silicon photovoltaic cells using scanning capacitance microscopy
Kosbar, L, Nxumalo, J, Nalaskowski, J, Hupka, L, Molella, C, Liu, J, Totir, G, Fisher, K, Cotte, J, Hopstaken, M
Published in 2010 35th IEEE Photovoltaic Specialists Conference (01.06.2010)
Published in 2010 35th IEEE Photovoltaic Specialists Conference (01.06.2010)
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Conference Proceeding
2-D shallow junction mapping by dual lens electron holography
Wang, Y. Y., Nxumalo, J., Ontalus, V., Krishnasamy, R., Katnani, A.
Published in 2017 17th International Workshop on Junction Technology (IWJT) (01.06.2017)
Published in 2017 17th International Workshop on Junction Technology (IWJT) (01.06.2017)
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Conference Proceeding
Characterizing junction profiles in Ge photodetectors using scanning capacitance microscopy (SCM) and electron holography
Nxumalo, J. N., Wang, Y.Y., Iwatake, M., Molella, C., Katnani, A., Orcutt, J., Ayala, J., Nummy, K.
Published in 2018 18th International Workshop on Junction Technology (IWJT) (01.03.2018)
Published in 2018 18th International Workshop on Junction Technology (IWJT) (01.03.2018)
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Conference Proceeding
Junction profiling on hot carrier stressed device by dual lens electron holography and scanning capacitance microscopy
Wang, Y.Y., Nxumalo, J., Ioannou, D., Katnani, A., Jeon, J., Bandy, K., Mcdonald, M., Bruley, J.
Published in 2018 18th International Workshop on Junction Technology (IWJT) (01.03.2018)
Published in 2018 18th International Workshop on Junction Technology (IWJT) (01.03.2018)
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Conference Proceeding
Hepatic blood flow measurement
Nxumalo, J L, Teranaka, M, Schenk, Jr, W G
Published in Archives of surgery (Chicago. 1960) (01.02.1978)
Published in Archives of surgery (Chicago. 1960) (01.02.1978)
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Journal Article
2D carrier mapping in Si/sub 1-x/Ge/sub x/ source/drain regions of PMOSFETs used in a production device by scanning capacitance microscopy
Nxumalo, J., Wintgens, C., Haythornthwaite, R., Ho, V.
Published in Extended Abstracts of the Fifth International Workshop on Junction Technology (2005)
Published in Extended Abstracts of the Fifth International Workshop on Junction Technology (2005)
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Conference Proceeding
Leakage issues in failure analysis of p+ SiGe active area short monitor
Arya, Ankur, Johnson, G. M., Ronsheim, P., Nxumalo, J., Molella, C. M., Murphy, R. J., Seung Chul Lee, Daleo, C., Bum Ki Moon, Onoda, H., Chung Woh Lai, Shenzhi Yang, Chow, Yew Tuck Clament, Lee, James
Published in 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2011)
Published in 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2011)
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Conference Proceeding
Precise determination of the mass difference 76Ge-76Se and a derived upper limit on the mass for the electron neutrino
Hykawy, JG, Nxumalo, JN, Unger, PP, Lander, CA, Barber, RC, Sharma, KS, Peters, RD, Duckworth, HE
Published in Physical review letters (23.09.1991)
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Published in Physical review letters (23.09.1991)
Journal Article