Development of a scanning atom probe and atom-by-atom mass analysis of diamonds
Nishikawa, O., Sekine, T., Ohtani, Y., Maeda, K., Numada, Y., Watanabe, M., Iwatsuki, M., Aoki, S., Itoh, J., Yamanaka, K.
Published in Applied physics. A, Materials science & processing (01.03.1998)
Published in Applied physics. A, Materials science & processing (01.03.1998)
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Journal Article
A trial scanning atom probe and field distribution at a tip apex of a micro-tip array
Nishikawa, O., Numada, Y., Iwatsuki, M., Aoki, S., Ishikawa, Y.
Published in 9th International Vacuum Microelectronics Conference (1996)
Published in 9th International Vacuum Microelectronics Conference (1996)
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Conference Proceeding