by Dhal, Sambandh Bhusan, Kalafatis, Stavros, Braga-Neto, Ulisses, Gadepally, Krishna Chaitanya, Landivar-Scott, Jose Luis, Zhao, Lei, Nowka, Kevin, Landivar, Juan, Pal, Pankaj, Bhandari, Mahendra
Published in Remote sensing (Basel, Switzerland) (01.06.2024)

by Gebara, Fadi H., Hofstee, H. Peter, Nowka, Kevin J.
Published in Computer (Long Beach, Calif.) (01.01.2015)

by Dhal, Sambandh Bhusan, Mahanta, Shikhadri, Gadepally, Krishna Chaitanya, He, Samuel, Hughes, Mary, Moore, Janie, Nowka, Kevin J., Kalafatis, Stavros
Published in SoutheastCon 2023 (01.04.2023)

by Singh, H., Agarwal, K., Sylvester, D., Nowka, K.J.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.11.2007)

by Drake, A.J., Nowka, K.J., Nguyen, T.Y., Burns, J.L., Brown, R.B.
Published in IEEE journal of solid-state circuits (01.09.2004)

by Wei Zhao, Liu, F., Agarwal, K., Acharyya, D., Nassif, S.R., Nowka, K.J., Yu Cao
Published in IEEE transactions on semiconductor manufacturing (01.02.2009)

by Keunwoo Kim, Kuang, J.B., Gebara, F.H., Ngo, H.C., Ching-Te Chuang, Nowka, K.J.
Published in IEEE transactions on electron devices (01.12.2009)

by Gadepally, Krishna Chaitanya, Bhusan Dhal, Sambandh, Kalafatis, Stavros, Nowka, Kevin J.
Published in 2023 IEEE/ACIS 21st International Conference on Software Engineering Research, Management and Applications (SERA) (23.05.2023)

by Wang, V., Agarwal, K., Nassif, S.R., Nowka, K.J., Markovic, D.
Published in IEEE transactions on semiconductor manufacturing (01.02.2009)

by Kuang, J.B., Keunwoo Kim, Ching-Te Chuang, Ngo, H.C., Gebara, F.H., Nowka, K.J.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.12.2008)

by Datta, Ramyanshu, Sebastine, Antony, Raghunathan, Ashwin, Carpenter, Gary, Nowka, Kevin, Abraham, Jacob A.
Published in Journal of electronic testing (01.12.2010)

by Zhao, Lei, Um, Dugan, Nowka, Kevin, Landivar-Scott, Jose Luis, Landivar, Juan, Bhandari, Mahendra
Published in Computers and electronics in agriculture (01.11.2024)

by Datta, Ramyanshu, Abraham, Jacob A., Utku Diril, Abdulkadir, Chatterjee, Abhijit, Nowka, Kevin J.
Published in Journal of electronic testing (01.06.2008)

by Nowka, Kevin J, Carpenter, Gary D, Brock, Bishop C
Published in IBM journal of research and development (01.09.2003)

by Nowka, Kevin J.
Published in Proceedings of Technical Program of 2012 VLSI Technology, System and Application (01.04.2012)

by Hofstee, H.P., Sang H. Dhong, Meltzer, D., Nowka, K.J., Silberman, J.A., Burns, J.I., Posluszny, S.D., Takahashi, O.
Published in IEEE MICRO (01.05.1998)

by Nowka, K.J., Carpenter, G.D., MacDonald, E.W., Ngo, H.C., Brock, B.C., Ishii, K.I., Nguyen, T.Y., Burns, J.L.
Published in IEEE journal of solid-state circuits (01.11.2002)

by Agarwal, K, Hayes, J, Barth, J, Jacunski, M, Nowka, K, Kirihata, T, Iyer, S
Published in 2010 Symposium on VLSI Circuits (01.06.2010)

by NOWKA KEVIN J
Year of Publication 06.02.2002

by Kuang, J. B., Schaub, J. D., Gebara, F. H., Wendel, D., Frohnel, T., Saroop, S., Nassif, S., Nowka, K.
Published in IEEE transactions on circuits and systems. I, Regular papers (01.09.2011)