Comparison of Silicon Surface Preparation Methods for Measurement of Minority Carrier Lifetime using the Microwave Photo-conductive Decay (μ-PCD) coupled with Continuous Corona Charge (Charge-PCD)
Pavelka, Tibor, Pap, Aron, Kenesei, Peter, Varga, Mariann, Novinics, F., Tallian, Miklos, Borionetti, Gabriella, Guaglio, Gianluca, Pfeffer, Markus, Don, Eric R.
Published in ECS transactions (25.09.2009)
Published in ECS transactions (25.09.2009)
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Journal Article
Integrated electrical and optical characterization of large area thin film photovoltaic materials
Szitasi, G., Korsos, F., Selmeczi, D., Takacs, O., Novinics, F., Tutto, P., Findlay, A., Wilson, M.
Published in 2012 38th IEEE Photovoltaic Specialists Conference (01.06.2012)
Published in 2012 38th IEEE Photovoltaic Specialists Conference (01.06.2012)
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Conference Proceeding