Evaluation of self-heating effects on an innovative SOI technology ("Venezia" process)
Villani, P., Favilla, S., Labate, L., Novarini, E., Ponza, A., Stella, R.
Published in Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005 (2005)
Published in Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005 (2005)
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Conference Proceeding
HBM and TLP ESD robustness in smart-power protection structures
Santirosia, S., Meneghesso, G., Novarini, E., Contieroa, C., Zanoni, E.
Published in Microelectronics and reliability (1999)
Published in Microelectronics and reliability (1999)
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Journal Article
Integrated Schottky diodes in BCD5 technology for high frequency soft switched power converters
Dallago, E., Sassone, G., Delbo, S., Gola, A., Novarini, E.
Published in 2000 IEEE 31st Annual Power Electronics Specialists Conference. Conference Proceedings (Cat. No.00CH37018) (2000)
Published in 2000 IEEE 31st Annual Power Electronics Specialists Conference. Conference Proceedings (Cat. No.00CH37018) (2000)
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Conference Proceeding
ESD robustness of smart-power protection structures evaluated by means of HBM and TLP tests
Meneghesso, G., Santirosi, S., Novarini, E., Contiero, C., Zanoni, E.
Published in 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) (2000)
Published in 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) (2000)
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Conference Proceeding