Stability of protective oxide films in waste incineration environment—solubility measurement of oxides in molten chlorides
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Journal Article
Conference Proceeding
A precise-tracking NBTI-degradation monitor independent of NBTI recovery effect
Saneyoshi, E., Nose, K., Mizuno, M.
Published in 2010 IEEE International Solid-State Circuits Conference - (ISSCC) (01.02.2010)
Published in 2010 IEEE International Solid-State Circuits Conference - (ISSCC) (01.02.2010)
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Conference Proceeding
A 280nW, 100kHz, 1-cycle start-up time, on-chip CMOS relaxation oscillator employing a feedforward period control scheme
Tokairin, T., Nose, K., Takeda, K., Noguchi, K., Maeda, T., Kawai, K., Mizuno, M.
Published in 2012 Symposium on VLSI Circuits (VLSIC) (01.06.2012)
Published in 2012 Symposium on VLSI Circuits (VLSIC) (01.06.2012)
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Conference Proceeding
MEASUREMENT DEVICE
MAHMOOD FARHAN, NOSE KOICHI, NAKAMURA YOSHIHIRO, NAGAO ATSUSHI, HIRASAWA NORIHITO
Year of Publication 30.08.2023
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Year of Publication 30.08.2023
Patent
20.3 A 23.9TOPS/W @ 0.8V, 130TOPS AI Accelerator with 16× Performance-Accelerable Pruning in 14nm Heterogeneous Embedded MPU for Real-Time Robot Applications
Nose, Koichi, Fujii, Taro, Togawa, Katsumi, Okumura, Shunsuke, Mikami, Kentaro, Hayashi, Daichi, Tanaka, Teruhito, Toi, Takao
Published in 2024 IEEE International Solid-State Circuits Conference (ISSCC) (18.02.2024)
Published in 2024 IEEE International Solid-State Circuits Conference (ISSCC) (18.02.2024)
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Conference Proceeding