The impact of gate-oxide breakdown on SRAM stability
Rodriguez, R., Stathis, J.H., Linder, B.P., Kowalczyk, S., Chuang, C.T., Joshi, R.V., Northrop, G., Bernstein, K., Bhavnagarwala, A.J., Lombardo, S.
Published in IEEE electron device letters (01.09.2002)
Published in IEEE electron device letters (01.09.2002)
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Journal Article
A digital correlator upgrade for the Arcminute MicroKelvin Imager
Hickish, Jack, Razavi-Ghods, Nima, Perrott, Yvette C, Titterington, David J, Carey, Steve H, Scott, Paul F, Grainge, Keith J B, Scaife, Anna M M, Alexander, Paul, Saunders, Richard D E, Crofts, Mike, Javid, Kamran, Rumsey, Clare, Jin, Terry Z, Ely, John A, Shaw, Clive, Northrop, Ian G, Pooley, Guy, D'Alessandro, Robert, Doherty, Peter, Willatt, Greg P
Published in Monthly notices of the Royal Astronomical Society (21.04.2018)
Published in Monthly notices of the Royal Astronomical Society (21.04.2018)
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Journal Article
Design methodology for the S/390 parallel enterprise Server G4 microprocessors
SHEPARD, K. L, CAREY, S. M, CHO, E. K, CURRAN, B. W, HATCH, R. F, HOFFMAN, D. E, MCCABE, S. A, NORTHROP, G. A, SEIGLER, R
Published in IBM journal of research and development (01.07.1997)
Published in IBM journal of research and development (01.07.1997)
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Journal Article
A 1.1GHz first 64b generation Z900 microprocessor
Curran, B, Camporese, P, Carey, S, Chan, Y, Chan, Y-H, Clemen, R, Crea, R, Hoffman, D, Koprowski, T, Mayo, M, McPherson, T, Northrop, G, Sigal, L, Smith, H, Tanzi, F, Williams, P
Published in Digest of technical papers - IEEE International Solid-State Circuits Conference (01.01.2001)
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Published in Digest of technical papers - IEEE International Solid-State Circuits Conference (01.01.2001)
Journal Article
Design technology co-optimization in technology definition for 22nm and beyond
Northrop, G.
Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
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Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
Conference Proceeding
Analysis of the effect of the gate oxide breakdown on SRAM stability
Rodrı́guez, R., Stathis, J.H., Linder, B.P., Kowalczyk, S., Chuang, C.T., Joshi, R.V., Northrop, G., Bernstein, K., Bhavnagarwala, A.J., Lombardo, S.
Published in Microelectronics and reliability (01.09.2002)
Published in Microelectronics and reliability (01.09.2002)
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Journal Article
Physical synthesis methodology for high performance microprocessors
Yiu-Hing Chan, Kudva, P., Lacey, L., Northrop, G., Rosser, T.
Published in Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451) (2003)
Published in Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451) (2003)
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Conference Proceeding
Backend CAD flows for "restrictive design rules"
Lavin, M., Heng, Fook-Luen, Northrop, G.
Published in IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004 (07.11.2004)
Published in IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004 (07.11.2004)
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Conference Proceeding
Chip integration methodology for the IBM S/390 G5 and G6 custom microprocessors
Averill, R M, Barkely, K G, Bowen, M A, Camporese, P J
Published in IBM journal of research and development (01.09.1999)
Published in IBM journal of research and development (01.09.1999)
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Journal Article
IBM eServer z900 high-frequency microprocessor technology, circuits, and design methodology
Curran, B W, Chan, Y H, Wu, P T, Camporese, P J
Published in IBM journal of research and development (01.07.2002)
Published in IBM journal of research and development (01.07.2002)
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Journal Article
Long-term containment of energetic particles in coronal loops
Lau, Yun-Tung, Northrop, Theodore G., Finn, John M.
Published in The Astrophysical journal (10.09.1993)
Published in The Astrophysical journal (10.09.1993)
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Journal Article
High performance bulk planar 20nm CMOS technology for low power mobile applications
Huiling Shang, Jain, S., Josse, E., Alptekin, E., Nam, M. H., Kim, S. W., Cho, K. H., Kim, I., Liu, Y., Yang, X., Wu, X., Ciavatti, J., Kim, N. S., Vega, R., Kang, L., Meer, H. V., Samavedam, S., Celik, M., Soss, S., Utomo, H., Ramachandran, R., Lai, W., Sardesai, V., Tran, C., Kim, J. Y., Park, Y. H., Tan, W. L., Shimizu, T., Joy, R., Strane, J., Tabakman, K., Lalanne, F., Montanini, P., Babich, K., Kim, J. B., Economikos, L., Cote, W., Reddy, C., Belyansky, M., Arndt, R., Kwon, U., Wong, K., Koli, D., Levedakis, D., Lee, J. W., Muncy, J., Krishnan, S., Schepis, D., Chen, X., Kim, B. D., Tian, C., Linder, B. P., Cartier, E., Narayanan, V., Northrop, G., Menut, O., Meiring, J., Thomas, A., Aminpur, M., Park, S. H., Lee, K. Y., Kim, B. Y., Rhee, S. H., Hamieh, B., Srivastava, R., Koshy, R., Goldberg, C., Pallachalil, M., Chae, M., Ogino, A., Watanabe, T., Oh, M., Mallela, H., Codi, D., Malinge, P., Weybright, M., Mann, R., Mittal, A., Eller, M., Lian, S., Li, Y., Divakaruni, R., Bukofsky, S., Kim, J. D., Sudijono, J., Neumueller, W., Matsuoka, F., Sampson, R.
Published in 2012 Symposium on VLSI Technology (VLSIT) (01.06.2012)
Published in 2012 Symposium on VLSI Technology (VLSIT) (01.06.2012)
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Conference Proceeding