by Boyer, A., Nolhier, N., Caignet, F., Dhia, S. Ben
Published in IEEE transactions on instrumentation and measurement (01.01.2021)

by Boyer, A., Nolhier, N., Caignet, F., Dhia, S. Ben
Published in 2022 International Symposium on Electromagnetic Compatibility – EMC Europe (05.09.2022)

by Courivaud, B., Nolhier, N., Ferru, G., Bafleur, M., Caignet, F.
Published in Microelectronics and reliability (01.09.2014)

by Monnereau, N., Caignet, F., Trémouilles, D., Nolhier, N., Bafleur, M.
Published in Microelectronics and reliability (01.02.2013)

by Monthéard, R, Airiau, C, Bafleur, M, Boitier, V, Dilhac, J-M, Dollat, X, Nolhier, N, Piot, E
Published in Journal of physics. Conference series (01.01.2014)

by Caigneť, F., Nolhier, N., Bafleur, M., Wang, A., Mauran, N.
Published in Microelectronics and reliability (01.09.2013)

by Ruan, J., Nolhier, N., Bafleur, M., Bary, L., Coccetti, F., Lisec, T., Plana, R.
Published in Microelectronics and reliability (01.09.2007)

by Ruan, J., Papaioannou, G.J., Nolhier, N., Mauran, N., Bafleur, M., Coccetti, F., Plana, R.
Published in Microelectronics and reliability (01.08.2008)

by Gendron, A., Renaud, P., Bafleur, M., Nolhier, N.
Published in Solid-state electronics (01.05.2008)

by Ruan, J., Nolhier, N., Papaioannou, G.J., Trémouilles, D., Puyal, V., Villeneuve, C., Idda, T., Coccetti, F., Plana, R.
Published in Microelectronics and reliability (01.09.2009)

by Delmas, A, Gendron, A, Bafleur, M, Nolhier, N, Gill, C
Published in 2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) (01.10.2010)

by Tremouilles, D., Bafleur, M., Bertrand, G., Nolhier, N., Mauran, N., Lescouzeres, L.
Published in IEEE journal of solid-state circuits (01.10.2004)

by Boyer, A., Nolhier, N., Caignet, F., Dhia, S. Ben
Published in 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium (26.07.2021)

by Bertrand, G., Delage, C., Bafleur, M., Nolhier, N., Dorkel, J.-M., Nguyen, Q., Mauran, N., Tremouilles, D., Perdu, P.
Published in IEEE journal of solid-state circuits (01.09.2001)

by Guitard, N., Essely, F., Trémouilles, D., Bafleur, M., Nolhier, N., Perdu, P., Touboul, A., Pouget, V., Lewis, D.
Published in Microelectronics and reliability (01.09.2005)

by GUITARD, N, TREMOUILLES, D, BAFLEUR, M, ESCOTTE, L, BARY, L, PERDU, P, SARRABAYROUSE, G, NOLHIER, N, REYNA-ROJAS, R
Published in Microelectronics and reliability (01.09.2004)

by Zecri, M., Besse, P., Givelin, P., Nayrolles, M., Bafleur, M., Nolhier, N.
Published in Microelectronics and reliability (01.09.2003)

by Salamero, C., Nolhier, N., Bafleur, M., Besse, P.
Published in Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005 (2005)

by Salamero, C., Nolhier, N., Bafleur, M., Zecri, M.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)

by Caignet, F., Nolhier, N., Bafleur, M., Wang, A., Mauran, N.
Published in Microelectronics and reliability (01.11.2015)