High Bit Cost Scalability and Reliable Cell Characteristics for 7th Generation 1Tb 4Bit/Cell 3D-NAND Flash
Kim, Kyungmoon, Seo, Yujeong, Park, Sejun, Jang, Woojae, Yoo, Dongho, Lim, Joonsung, Park, Il-Han, Lee, Jaeduk, Noh, Kyungyoon, Ahn, Sujin, Hur, Sunghoi
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
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Conference Proceeding
Development of 7th generation 3D VNAND Flash Product with COP structure for Growing Demand in Storage Market
Lim, Joonsung, Chung, Soochan, Ko, Dong-Hyeon, Sung, Suk-Kang, Noh, Kyungyoon, Ahn, Su Jin, Song, Jai Hyuk
Published in 2022 International Conference on Electronics, Information, and Communication (ICEIC) (06.02.2022)
Published in 2022 International Conference on Electronics, Information, and Communication (ICEIC) (06.02.2022)
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Conference Proceeding
Process Improvements for 7th Generation 1Tb Quad-Level Cell 3D NAND Flash Memory in Mass Production
Chung, Soochan, Ko, Dong-Hyeon, Lim, Joonsung, Kim, Kyungmoon, Takaki, Sejie, Seo, Yujeong, Lee, Byoungil, Park, Sejun, Lee, Jaeduk, Noh, Kyungyoon, Ahn, Su Jin, Hur, Sunghoi
Published in 2023 IEEE International Memory Workshop (IMW) (01.05.2023)
Published in 2023 IEEE International Memory Workshop (IMW) (01.05.2023)
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Conference Proceeding