by Woo, Changbeom, Kim, Shinkeun, Park, Jaeyeol, Shin, Hyungcheol, Kim, Haesoo, Choi, Gil-Bok, Seo, Moon-Sik, Noh, Keum Hwan
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)

by Noh, Keum Hwan, Kang, Young Min, Yang, Beelyong, Lee, Seok Won, Lee, Seaung-Suk, Park, Young-Jin
Published in Japanese Journal of Applied Physics (01.11.2002)

by Noh, Keum Hwan, Yang, Beelyong, Lee, Seok Won, Lee, Seaung-Suk, Kang, Hee-Bok, Park, Young-Jin
Published in Japanese Journal of Applied Physics (2003)

by NOH, KEUM HWAN
Year of Publication 06.01.2011

by NOH, KEUM HWAN
Year of Publication 31.12.2010

by NOH, KEUM HWAN
Year of Publication 14.06.2010

by NOH, KEUM HWAN
Year of Publication 09.04.2010

by NOH, KEUM HWAN
Year of Publication 11.03.2010

by NOH, KEUM HWAN
Year of Publication 02.07.2009

by Keun Woo Lee, Se Kyoung Choi, Sung Jae Chung, Hye Lyoung Lee, Su Min Yi, Byeong Il Han, Byung In Lee, Dong Hwan Lee, Ji Hyun Seo, Noh Yong Park, Hae Soo Kim, Hyung Seok Kim, Tae Un Youn, Keum Hwan Noh, Min Kyu Lee, Ju Yeab Lee, Kwang Hee Han, Won Sic Woo, Seok Won Cho, Seung Cheol Lee, Sung Soon Kim, Chan Sun Hyun, Weon Joon Suh, Sang Deok Kim, Myung Kyu Ahn, Hyeon Soo Kim, Ki Seog Kim, Gyu Seog Cho, Sung Kye Park, Aritome, S., Jin Woong Kim, Seok Kiu Lee, Sung Joo Hong, Sung Wook Park
Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)

by OH, Sang-Hyun, KEUM HWAN NOH, SEAUNG SUK LEE, KANG, Hee-Bok, YOUNG HO YANG, LEE, Kye-Nam, HONG, Suk-Kyoung, PARK, Young-Jin
Published in Journal of the Electrochemical Society (2004)

by NOH, KEUM HWAN, KIM, HYUNG SEOK
Year of Publication 06.08.2010

by JEONG, HYEOK-JE, NOH, KEUM-HWAN, LEE, SEAUNG-SUK, HONG, SUK-KYOUNG, KANG, JONG-HO, PARK, KUN-WOO
Published in Integrated ferroelectrics (14.05.2007)

by Hae Soo Kim, Kang Jae Lee, Kwang Hee Han, Seok Won Cho, Se Kyoung Choi, Shin Won Seo, Jae Hyun Chung, Keun Woo Lee, Sung Jae Chung, Keum Hwan Noh, Tae Un Youn, Ju Yeab Lee, Min Kyu Lee, Byeong Il Han, Su Min Yi, Ho Seok Lee, Sung Soon Kim, Wan Sup Shin, Kwang Hyun Yun, Min Sung Ko, Jin Kwan Choi, Sang Wan Lee, Sang Deok Kim, Myung Kyu Ahn, Ki Seog Kim, Young Ho Jeon, Sung Kye Park, Aritome, Seiichi, Jin Woong Kim, Sang Sun Lee, Seok Kiu Lee, Kun Ok Ahn, Sung Joo Hong, Gi Hyun Bae, Sung Wook Park
Published in Proceedings of Technical Program of 2012 VLSI Technology, System and Application (01.04.2012)

by Kim, Nam-Kyeong, Hong, Se-Hee, Shim, Sa-Yong, Park, Min-Hee, Hwang, Kyung-Pil, Lee, Min-Kyu, Lee, Ju-Yeab, Woo, Won-Sic, Noh, Keum-Hwan, Lee, Hee-Kee, Om, Jae-Chul, Lee, Seok-Kiu, Bae, Gi-Hyun
Published in Japanese Journal of Applied Physics (01.01.2008)

by Oh, Sang-Hyun, Noh, Keum Hwan, Lee, Seaung Suk, Kang, Hee-Bok, Yang, Young Ho, Lee, Kye-Nam, Hong, Suk-Kyoung, Park, Young-Jin
Published in Journal of the Electrochemical Society (2004)

by Kim, Shinkeun, Kim, Haesoo, Woo, Changbeom, Choi, Gil-Bok, Seo, Moon-Sik, Shim, Hyunyoung, Noh, Keum Hwan, Shin, Hyungcheol
Published in IEEE transactions on electron devices (01.06.2020)

by Kim, Dongguen, Kim, Heejin, Kim, Yejin, Chae, Minwoo, Ko, Young Myoung, Bae, Young-Mok, Sim, Hyungsub, Oh, Young Chan, Noh, Keum Hwan
Published in Journal of the Korean Statistical Society (07.08.2024)

by KWUN, Sook-Il, KEUM HWAN NOH, YOON, Jong-Gul
Published in Ferroelectrics (Print) (2002)

by Lee, Seaung-Suk, Noh, Keum-Hwan
Published in Integrated ferroelectrics (01.01.2003)