Modeling IP responses in test case generation for systems-on-chip verification
Bose, M., Nodine, M.H., Jurasz, W.R., Zavadsky, V., Chodavadia, A., Nunes, L.R.
Published in Proceedings. 4th International Workshop on Microprocessor Test and Verification - Common Challenges and Solutions (2003)
Published in Proceedings. 4th International Workshop on Microprocessor Test and Verification - Common Challenges and Solutions (2003)
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