FIB-SEM based 3D tomography of micro-electronic components: Application to automotive high-definition LED lighting systems
Noçairi, Safa, Compère, Nicolas, Bermond, Antonin, Roucoules, Christine, Sao-Joao, Sergio, Lenci, Matthieu, Kermouche, Guillaume, Klöcker, Helmut
Published in Microelectronics and reliability (01.10.2022)
Published in Microelectronics and reliability (01.10.2022)
Get full text
Journal Article
Automotive optoelectronic components submitted to thermal shock: Impact of component architecture on mechanical reliability
NOCAIRI, Safa, Maarouf, Khalil, Roucoules, Christine, Kermouche, Guillaume, Sao-Joao, Sergio, Klöcker, Helmut
Published in Microelectronics and reliability (01.01.2022)
Published in Microelectronics and reliability (01.01.2022)
Get full text
Journal Article