Annealing of damage in Se +-implanted indium phosphide
Woodhouse, J.D., Donnelly, J.P., Nitishin, P.M., Owens, E.B., Ryan, J.L.
Published in Solid-state electronics (01.01.1984)
Published in Solid-state electronics (01.01.1984)
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Journal Article
Bright-field Analysis Of Field-emission Cones Using High-resolution Transmission Electron Microscopy
Goodhue, W.D., Nitishin, P.M., Harris, C.T., Bozler, C.O., Rathman, D.D., Johnson, G.D., Hollis, M.A.
Published in [Proceedings] IVMC '93 Sixth International Vacuum Microelectronics Conference (1993)
Published in [Proceedings] IVMC '93 Sixth International Vacuum Microelectronics Conference (1993)
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Conference Proceeding