넓은 X선 빔 및 원주 방향으로 배열된 검출 기구를 갖는 이미징 시스템
STAR LACK JOSH M, NISIUS DAVID T, ANDREWS GREGORY C, SHEDLOCK DANIEL, EHRAT MATTHIAS, STAMM MICHAEL
Year of Publication 12.04.2024
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Year of Publication 12.04.2024
Patent
Linatron Mi6, the X-Ray Source for Cargo Inspection
Chen, Gongyin, Turner, John, Nisius, David, Holt, Kevin, Brooks, Alan
Published in Physics procedia (2015)
Published in Physics procedia (2015)
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Journal Article
Scatter Correction for Industrial Cone-Beam Computed Tomography (CBCT) Using VSHARP, a fast GPU-Based Linear Boltzmann Transport Equation Solver
Shiroma, Amy, Star-lack, Josh, Holt, Kevin, Hu, Martin, Hoelzer, Steve, YOON, Sungwon, Sosnovsky, Eugeny, Failla, Gregory, WANG, Adam, Kokkonen, Petri, Ruprech, Martin, Maslowski, Alexander, Nisius, David
Published in E-journal of Nondestructive Testing (01.03.2019)
Published in E-journal of Nondestructive Testing (01.03.2019)
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Journal Article