Reproducibility of XPS analysis for film thickness of SiO2/Si by active Shirley method
Matsumoto, Ryo, Nishizawa, Yugo, Kataoka, Noriyuki, Tanaka, Hiromi, Yoshikawa, Hideki, Tanuma, Shigeo, Yoshihara, Kazuhiro
Published in Journal of electron spectroscopy and related phenomena (01.02.2016)
Published in Journal of electron spectroscopy and related phenomena (01.02.2016)
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Journal Article
初期端点の自動調整機能を付加したactive Shirley法によるXPSバックグラウンドの自動推定
西澤, 侑吾, 松本, 凌, 片岡, 範行, 田中, 博美, 吉川, 英樹, 田沼, 繁夫, 吉原, 一紘
Published in Journal of Surface Analysis (2017)
Published in Journal of Surface Analysis (2017)
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Journal Article
動的Shirley法によるXPSスペクトルのバックグラウンド自動推定と定量分析
松本, 凌, 西澤, 侑吾, 片岡, 範行, 田中, 博美, 吉川, 英樹, 田沼, 繁夫, 吉原, 一紘
Published in Journal of Surface Analysis (2016)
Published in Journal of Surface Analysis (2016)
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Journal Article
Automatic Estimation of XPS spectrum Background Using an Active Shirley Method Improved by Auto-Tuning Function of Initial End Points
Nishizawa, Yugo, Matsumoto, Ryo, Kataoka, Noriyuki, Tanaka, Hiromi, Yoshikawa, Hideki, Tanuma, Shigeo, Yoshihara, Kazuhiro
Published in Journal of Surface Analysis (2017)
Published in Journal of Surface Analysis (2017)
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Journal Article
Automatic Background Estimation and Quantitative Analysis for XPS Spectrum by Active Shirley Method
Matsumoto, Ryo, Nishizawa, Yugo, Kataoka, Noriyuki, Tanaka, Hiromi, Yoshikawa, Hideki, Tanuma, Shigeo, Yoshihara, Kazuhiro
Published in Journal of Surface Analysis (2016)
Published in Journal of Surface Analysis (2016)
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Journal Article
Automatic Background Estimation and Quantitative Analysis for XPS Spectrum by Active Shirley Method
Matsumoto, Ryo, Nishizawa, Yugo, Kataoka, Noriyuki, Tanaka, Hiromi, Yoshikawa, Hideki, Tanuma, Shigeo, Yoshihara, Kazuhiro
Published in Journal of surface analysis (01.07.2015)
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Published in Journal of surface analysis (01.07.2015)
Journal Article