Thermal stress reliability comparison of WB and POL-kW structure by Power cycling and simulation
Nishihara, Youichi, Bando, Koji, Hayashibe, Shingo, Yumoto, Takumi, Yoshida, Tatsuro, Ota, Hiroko
Published in 2023 IEEE Applied Power Electronics Conference and Exposition (APEC) (19.03.2023)
Published in 2023 IEEE Applied Power Electronics Conference and Exposition (APEC) (19.03.2023)
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Conference Proceeding
Evaluation of electrical and thermal properties of POL-kW by simulation and actual measurement
Nishihara, Youichi, Bando, Koji, Hayashibe, Shingo, Yumoto, Takumi, Ikeda, Takumi, Gomyo, Toshio
Published in 2022 IEEE CPMT Symposium Japan (ICSJ) (09.11.2022)
Published in 2022 IEEE CPMT Symposium Japan (ICSJ) (09.11.2022)
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Conference Proceeding