Development of a time-resolved immunochromatographic test strip for rapid and quantitative determination of GFAP in serum
Wang, Yupeng, Yu, Zhiyong, Ning, Zhenqiu, Li, Minghui, Li, Weiping, Zhong, Yizhe, Chen, Huiqiang, Zhang, Xi, Tang, Xialin, Cheng, Xiao, Li, Laiqing, Aigul, Abduldayeva, Zan, Jie
Published in Mikrochimica acta (1966) (01.06.2024)
Published in Mikrochimica acta (1966) (01.06.2024)
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Journal Article
Astrocytic endothelin-1 overexpression impairs learning and memory ability in ischemic stroke via altered hippocampal neurogenesis and lipid metabolism
Li, Jie, Jiang, Wen, Cai, Yuefang, Ning, Zhenqiu, Zhou, Yingying, Wang, Chengyi, Chung, Sookja, Huang, Yan, Sun, Jingbo, Deng, Minzhen, Zhou, Lihua, Cheng, Xiao
Published in Neural regeneration research (01.03.2024)
Published in Neural regeneration research (01.03.2024)
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Journal Article
Plasma Inflammation Markers Linked to Complications and Outcomes after Spontaneous Intracerebral Hemorrhage
Cheng, Xiao, Hu, Dafeng, Wang, Chengyi, Lu, Ting, Ning, Zhenqiu, Li, Kunhong, Ren, Zhixuan, Huang, Yan, Zhou, Lihua, Chung, Sookja Kim, Liu, Zhenchuan, Xia, Zhangyong, Meng, Wei, Tang, Guanghai, Sun, Jingbo, Guo, Jianwen
Published in Journal of proteome research (03.09.2024)
Published in Journal of proteome research (03.09.2024)
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Journal Article
Life condition monitoring on smart power devices using a sequence of current and charge-based capacitance measurements
Zhenqiu Ning, de Vylder, E., Vlachakis, B., Delecourt, H.-X., Gillon, R., Van Torre, P., Hegsted, D.
Published in 2008 IEEE International Conference on Microelectronic Test Structures (01.03.2008)
Published in 2008 IEEE International Conference on Microelectronic Test Structures (01.03.2008)
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Conference Proceeding
Analog characterization of dielectric relaxation of MIM capacitor using an improved recovery voltage technique
Zhenqiu Ning, Casier, H., Gillon, R., Delecourt, H.-X., Tack, D., de Vylder, E., van Torre, P., Hegsted, D.
Published in 2007 IEEE International Conference on Microelectronic Test Structures (01.03.2007)
Published in 2007 IEEE International Conference on Microelectronic Test Structures (01.03.2007)
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Conference Proceeding
Precise analogue characterization of MIM capacitors using an improved charge-based capacitance measurement (CBCM) technique
Zhenqiu Ning, Delecourt, H.-X., De Schepper, L., Gillon, R., Tack, M.
Published in Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005 (2005)
Published in Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005 (2005)
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Conference Proceeding
A Novel Test Structure for Sub-micron CMOS Leakage Characterisation and Modelling
Zhenqiu Ning, Hoste, S., Vanderbauwhede, W., Gillon, R., Tack, M., Raes, P.
Published in 30th European Solid-State Device Research Conference (2000)
Published in 30th European Solid-State Device Research Conference (2000)
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Conference Proceeding
A simple and accurate capacitance ratio measurement technique for integrated circuit capacitor arrays
Zhenqiu Ning, De Schepper, L., Delecourt, H.-X., Gillon, R., Tack, M.
Published in Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005 (2005)
Published in Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005 (2005)
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Conference Proceeding
Bus receiver based on current mode
YU YUEHUI, DONG CHUNLEI, LI JIANPENG, JIN XING, ZHANG ZHENGMIN, NING ZHENQIU
Year of Publication 14.05.2014
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Year of Publication 14.05.2014
Patent
Implementation of statistical characterisation and design techniques for an industrial 0.5 /spl mu/m CMOS technology
Healy, S., Horan, E., McCarthy, K., Mathewson, A., Zhenqiu Ning, Rombouts, E., Vanderbauwhede, W., Tack, M.
Published in ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) (1999)
Published in ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) (1999)
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Conference Proceeding