Limitations in the accuracy of photoconductance-based lifetime measurements
Schüler, N., Anger, S., Dornich, K., Niklas, J.R., Bothe, K.
Published in Solar energy materials and solar cells (01.03.2012)
Published in Solar energy materials and solar cells (01.03.2012)
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Journal Article
Explanation of positive and negative PICTS peaks in SI-GaAs
Schmerler, S., Hahn, T., Hahn, S., Niklas, J. R., Gründig-Wendrock, B.
Published in Journal of materials science. Materials in electronics (01.12.2008)
Published in Journal of materials science. Materials in electronics (01.12.2008)
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Journal Article
Conference Proceeding
Interpretation of lifetime and defect spectroscopy measurements by generalized rate equations
Hahn, T., Schmerler, S., Hahn, S., Niklas, J. R., Gruendig-Wendrock, B.
Published in Journal of materials science. Materials in electronics (01.12.2008)
Published in Journal of materials science. Materials in electronics (01.12.2008)
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Journal Article
Conference Proceeding
Fast, high resolution, inline contactless electrical semiconductor characterization for photovoltaic applications by microwave detected photoconductivity
Dornich, K., Schüler, N., Berger, B., Niklas, J.R.
Published in Materials science & engineering. B, Solid-state materials for advanced technology (15.05.2013)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (15.05.2013)
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Journal Article
Activation energies of the EL6 trap and of the 0.15 eV donor and their correlation in GaAs
Richter, T, Kühnel, G, Siegel, W, Niklas, J R
Published in Semiconductor science and technology (01.11.2000)
Published in Semiconductor science and technology (01.11.2000)
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Journal Article
Point-contact measurements for high-resolution profiling of high-resistivity III - V semiconductors
Siegel, W, Kühnel, G, Niklas, J R, Jurisch, M, Hoffman, B
Published in Semiconductor science and technology (01.06.1996)
Published in Semiconductor science and technology (01.06.1996)
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Journal Article
High resolution inline detection of changes in the conduction type of multicrystalline silicon by contact less photoconductivity measurements
Schuler, N, Mittelstrass, D, Dornich, K, Niklas, J R
Published in 2010 35th IEEE Photovoltaic Specialists Conference (01.06.2010)
Published in 2010 35th IEEE Photovoltaic Specialists Conference (01.06.2010)
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Conference Proceeding
Contact-less electrical defect characterisation of silicon by MD-PICTS
Dornich, K., Niemietz, K., Wagner, Mt, Niklas, J.R.
Published in Materials science in semiconductor processing (01.02.2006)
Published in Materials science in semiconductor processing (01.02.2006)
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Journal Article
Conference Proceeding
An electron spin resonance study of vanadium-doped alpha -TeO2 single crystals
Edwards, G J, Gilliam, O R, Bartram, R H, Watterich, A, Voszka, R, Niklas, J R, Greulich-Weber, S, Spaeth, J -M
Published in Journal of physics. Condensed matter (10.04.1995)
Published in Journal of physics. Condensed matter (10.04.1995)
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Journal Article
Next generation inline minority carrier lifetime metrology on multicrystalline silicon bricks for PV
Schuler, N, Mittelstrass, D, Dornich, K, Niklas, J R, Neuhaus, H
Published in 2010 35th IEEE Photovoltaic Specialists Conference (01.06.2010)
Published in 2010 35th IEEE Photovoltaic Specialists Conference (01.06.2010)
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Conference Proceeding
Topography of Defect Parameters on Si and GaAs Wafers
Dornich, K., Gründig-Wendrock, B., Hahn, T., Niklas, J.R.
Published in Advanced engineering materials (01.07.2004)
Published in Advanced engineering materials (01.07.2004)
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Journal Article
GaAs wafer mapping by microwave-detected photoconductivity
Niklas, J.R., Siegel, W., Jurisch, M., Kretzer, U.
Published in Materials science & engineering. B, Solid-state materials for advanced technology (22.03.2001)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (22.03.2001)
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Journal Article
Conference Proceeding
Contact-free defect investigation of wafer-annealed Fe-doped SI-InP
Hahn, S., Dornich, K., Hahn, T., Köhler, A., Niklas, J.R.
Published in Materials science in semiconductor processing (01.02.2006)
Published in Materials science in semiconductor processing (01.02.2006)
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Journal Article
Conference Proceeding
Defect specific topography of GaAs wafers by microwave-detected photo induced current transient spectroscopy
Gründig-Wendrock, B., Jurisch, M., Niklas, J.R.
Published in Materials science & engineering. B, Solid-state materials for advanced technology (30.04.2002)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (30.04.2002)
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Journal Article
Conference Proceeding
The structure of chalcogen pairs in silicon
Greulich-Weber, S, Niklas, J R, Spaeth, J -M
Published in Journal of physics. Condensed matter (09.01.1989)
Published in Journal of physics. Condensed matter (09.01.1989)
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Journal Article
Radiation-induced intrinsic defects in TeO2
Corradi, G, Watterich, A, Foldvari, I, Voszka, R, Niklas, J R, Spaeth, J -M, Gilliam, O R, Kappers, L A
Published in Journal of physics. Condensed matter (14.05.1990)
Published in Journal of physics. Condensed matter (14.05.1990)
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Journal Article
Photoluminescence topography, PICTS and microwave conductivity investigation of EL6 in GaAs
Steinegger, Th, Gründig-Wendrock, B., Baeumler, M., Jurisch, M., Jantz, W., Niklas, J.R.
Published in Materials science & engineering. B, Solid-state materials for advanced technology (30.04.2002)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (30.04.2002)
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Journal Article
Conference Proceeding
Investigation of Cu-related deep levels in semi-insulating GaAs by PICTS
Zychowitz, G., Siegel, W., Steinegger, T., Kühnel, G., Niklas, J.-R.
Published in Physica. B, Condensed matter (01.12.2001)
Published in Physica. B, Condensed matter (01.12.2001)
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