by Niggemeyer, D., Rudnick, E.M.
Published in IEEE transactions on computers (01.09.2004)

by Niggemeyer, D., Rudnick, E.M.
Published in Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 (2001)

by Niggemeyer, D., Redeker, M., Otterstedt, J.
Published in Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. No.98TB100236) (1998)

by Niggemeyer, D., Redeker, M., Rudnick, E.M.
Published in Records of the IEEE International Workshop on Memory Technology, Design and Testing (2000)

by Niggemeyer, D., Stephano, K.J., Rudnick, E.M.
Published in IEEE transactions on education (01.08.2001)

by Nordholz, P., Treytnar, D., Otterstedt, J., Grabinski, H., Niggemeyer, D., Williams, T.W.
Published in Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) (1998)

by Niggemeyer, D., Ruffer, M.
Published in Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078) (1999)

by Otterstedt, J., Niggemeyer, D., Williams, T.W.
Published in Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) (1998)

by Hilgenstock, Jörg, Herrmann, Klaus, Otterstedt, Jan, Niggemeyer, Dirk, Pirsch, Peter
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 35th annual conference on Design automation; 15-19 June 1998 (01.01.1998)

by Redeker, M., Rudack, M., Lobe, T., Niggemeyer, D.
Published in Records of the IEEE International Workshop on Memory Technology, Design and Testing (2000)

by Niggemeyer, D., Otterstedt, J., Redeker, M.
Published in Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. NO.97TB100159) (1997)

by Nordholz, P., Grabinski, H., Treytnar, D., Otterstedt, J., Niggemeyer, D., Arz, U., Williams, T.W.
Published in Proceedings Design, Automation and Test in Europe (1998)

by Nordholz, P., Otterstedt, J., Niggemeyer, D.
Published in 1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon (1996)

by Mende, Ole, Niggemeyer, Dirk
Published in Applied surface science (15.12.2000)

by Nordholz, P., Grabinski, H., Treytnar, D., Otterstedt, J., Niggemeyer, D., Arz, U., Williams, T. W.
Published in Design, Automation, and Test in Europe: Proceedings of the conference on Design, automation and test in Europe; 23-26 Feb. 1998 (23.02.1998)

by Bergfeld, T.J., Niggemeyer, D., Rudnick, E.M.
Published in Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537) (2000)

by Mende, Ole, Niggemeyer, Dirk
Published in Microelectronics and reliability (01.08.2000)

by Rudack, M., Niggemeyer, D.
Published in Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) (1999)