by Rossi, D., Nieuwland, A.K., van Dijk, S.V.E., Kleihorst, R.P., Metra, C.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.05.2008)

by Rossi, D., Metra, C., Nieuwland, A.K., Katoch, A.
Published in IEEE design & test of computers (01.01.2005)

by Rossi, D., Metra, C., Nieuwland, A.K., Katoch, A.
Published in IEEE design & test of computers (01.07.2005)

by Rossi, D., Nieuwland, A.K., Metra, C.
Published in IEEE design & test of computers (01.01.2008)

by Rossi, D., van Dijk, V.E.S., Kleihorst, R.P., Nieuwland, A.K., Metra, C.
Published in 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003 (2003)

by Kretzschmar, C., Nieuwland, A.K., Muller, D.
Published in Proceedings Design, Automation and Test in Europe Conference and Exhibition (2004)

by Nieuwland, A.K., Jasarevic, S., Jerin, G.
Published in 12th IEEE International On-Line Testing Symposium (IOLTS'06) (2006)

by Nieuwland, A.K., Lippens, P.E.R.
Published in 1998 IEEE Workshop on Signal Processing Systems. SIPS 98. Design and Implementation (Cat. No.98TH8374) (1998)

by Nieuwland, A.K., Gindner, P.
Published in Proceedings. 10th IEEE International On-Line Testing Symposium (2004)

by Nieuwland, A.K., Katoch, A., Rossi, D., Metra, C.
Published in 11th IEEE International On-Line Testing Symposium (2005)

by A.K. NIEUWLAND, O.P. GANGWAL, P. VAN DER WOLF
Year of Publication 22.09.2004

by Rossi, D., Muccio, A., Nieuwland, A.K., Katoch, A., Metra, C.
Published in Proceedings. 10th IEEE International On-Line Testing Symposium (2004)

by Nieuwland, A.K., Kleihorst, R.P.
Published in 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003 (2003)