by Deleonibus, S., Caillat, C., Guegan, G., Heitzmann, M., Nier, M.E., Tedesco, S., Dal'zotto, B., Martin, F., Mur, P., Papon, A.M., Lecarval, G., Biswas, S., Souil, D.
Published in IEEE electron device letters (01.04.2000)

by Ducroquet, F, Achard, H, Coudert, F, Previtali, B, Lugand, J.-F, Ulmer, L, Farjot, T, Gobil, Y, Heitzmann, M, Tedesco, S, Nier, M.E, Deleonibus, S
Published in IEEE transactions on electron devices (01.08.2001)

by Ducroquet, F., Achard, H., Coudert, F., Previtali, B., Lugand, J.-F., Ulmer, L., Farjot, T., Gobil, Y., Heitzmann, M., Tedesco, S., Nier, M.E., Deleonibus, S.
Published in IEEE transactions on electron devices (01.08.2001)

by Charvolin, T., Hadji, E., Picard, E., Zelsman, M., Assous, M., Dalzotto, B., Nier, M.E., Tedesco, S., Letartre, X., Rojo-Roméo, P., Seassal, C.
Published in Microelectronic engineering (01.07.2002)

by Louis, D., Nier, M.E., Fery, C., Heitzmann, M., Papon, A.M., Renard, S.
Published in Microelectronic engineering (01.07.2002)

by Ducroquet, F., Achard, H., Coudert, F., Previtali, B., Lugand, J.-F., Ulmer, L., Farjot, T., Gobil, Y., Heitzmann, M., Tedesco, S., Nier, M.E., Deleonibus, S.
Published in IEEE transactions on electron devices (01.08.2001)

by Heitzmann, M., Nier, M.E.
Published in Microelectronic engineering (01.06.2000)

by Deleonibus, S., Caillat, C., Guegan, G., Heitzmann, M., Nier, M.E., Tedesco, S., Dal'zotto, B., Martin, F., Mur, P., Papon, A.M., Lecarval, G., Biswas, S., Souil, D.
Published in IEEE electron device letters (01.04.2000)

by Guegan, G., Deleonibus, S., Caillat, C., Tedesco, S., Dal’zotto, B., Heitzmann, M., Nier, M.E., Mur, P.
Published in Solid-state electronics (01.03.2002)

by Caillat, C., Deleonibus, S., Guegan, G., Heitzmann, M., Nier, M.E., Tedesco, S., Dal'zotto, B., Martin, F., Mur, P., Papon, A.M., Lecarval, G., Previtali, B., Toffoli, A., Allain, F., Biswas, S., Jourdan, F., Fugier, P., Dichiaro, J.L.
Published in Solid-state electronics (01.03.2002)

by Palun, L., Tedesco, S., Heitzman, M., Martin, F., Fraboulet, D., Dal'zotto, B., Nier, M.E., Mur, P., Charvolin, T., Mariolle, D., Tardif, F.
Published in Microelectronic engineering (01.06.2000)

by Guegan, G., Deleonibus, S., Bertrand, G., Souil, D., Rivallin, P., Tedesco, S., Mur, P., Holliger, P., Nier, M.E.
Published in 31st European Solid-State Device Research Conference (2001)

by Fraboulet, D., Jehl, X., Mariolle, D., Le Royer, C., Le Carval, G., Scheiblin, P., Rivallin, P., Mollard, L., Deleroyelle, D., Nier, M.E., Toffoli, A., Molas, G., De Salvo, B., Deleonibus, S., Sanquer, M.
Published in 32nd European Solid-State Device Research Conference (2002)

by Achard, H., Ducroquet, F., Coudert, F., Previtali, B., Lugand, J.F., Ulmer, L., Farjot, T., Gobil, Y., Heitzmann, M., Tedesco, S., Nier, M.E., Deleonibus, S.
Published in 30th European Solid-State Device Research Conference (2000)

by Guegan, G., Souil, D., Deleonibus, S., Tedesco, S., Laviron, C., Previtali, P., Nier, M.E.
Published in 32nd European Solid-State Device Research Conference (2002)