Degradation testing and failure analysis of DC film capacitors under high humidity conditions
Wang, Huai, Nielsen, Dennis A., Blaabjerg, Frede
Published in Microelectronics and reliability (01.08.2015)
Published in Microelectronics and reliability (01.08.2015)
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Journal Article
Electric field mapping inside metallized film capacitors
Nielsen, Dennis A., Popok, Vladimir N., Pedersen, Kjeld
Published in 2015 Annual Reliability and Maintainability Symposium (RAMS) (01.01.2015)
Published in 2015 Annual Reliability and Maintainability Symposium (RAMS) (01.01.2015)
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Conference Proceeding