Analysis of organic multilayers and 3D structures using Ar cluster ions
Niehuis, E., Möllers, R., Rading, D., Cramer, H.-G., Kersting, R.
Published in Surface and interface analysis (01.01.2013)
Published in Surface and interface analysis (01.01.2013)
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Journal Article
Conference Proceeding
Surface spectrometry using large argon clusters
Kayser, S., Rading, D., Moellers, R., Kollmer, F., Niehuis, E.
Published in Surface and interface analysis (01.01.2013)
Published in Surface and interface analysis (01.01.2013)
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Conference Proceeding
Depth profiling of organic materials using improved ion beam conditions
Cramer, H.-G., Grehl, T., Kollmer, F., Moellers, R., Niehuis, E., Rading, D.
Published in Applied surface science (15.12.2008)
Published in Applied surface science (15.12.2008)
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Journal Article
Organic depth profiling of C60 and C60/phthalocyanine layers using argon clusters
Mouhib, T., Poleunis, C., Möllers, R., Niehuis, E., Defrance, P., Bertrand, P., Delcorte, A.
Published in Surface and interface analysis (01.01.2013)
Published in Surface and interface analysis (01.01.2013)
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Journal Article
Conference Proceeding
Dual beam depth profiling of organic materials: Variations of analysis and sputter beam conditions
Rading, D., Moellers, R., Kollmer, F., Paul, W., Niehuis, E.
Published in Surface and interface analysis (01.01.2011)
Published in Surface and interface analysis (01.01.2011)
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Journal Article
Conference Proceeding
TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Ar+n, C+60 and Cs+ sputtering ions: A comparative study
WEHBE, N, TABARRANT, T, BRISON, J, MOUHIB, T, DELCORTE, A, BERTRAND, P, MOELLERS, R, NIEHUIS, E, HOUSSIAU, L
Published in Surface and interface analysis (2013)
Published in Surface and interface analysis (2013)
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Conference Proceeding
Journal Article
TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn+, C60+ and Cs+ sputtering ions: A comparative study
Wehbe, N., Tabarrant, T., Brison, J., Mouhib, T., Delcorte, A., Bertrand, P., Moellers, R., Niehuis, E., Houssiau, L.
Published in Surface and interface analysis (01.01.2013)
Published in Surface and interface analysis (01.01.2013)
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Journal Article
Dual beam depth profiling of polymer materials: comparison of C60 and Ar cluster ion beams for sputtering
Rading, D., Moellers, R., Cramer, H.-G., Niehuis, E.
Published in Surface and interface analysis (01.01.2013)
Published in Surface and interface analysis (01.01.2013)
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Journal Article
Conference Proceeding
Influence of primary ion bombardment conditions on the emission of molecular secondary ions
Kersting, R., Hagenhoff, B., Kollmer, F., Möllers, R., Niehuis, E.
Published in Applied surface science (15.06.2004)
Published in Applied surface science (15.06.2004)
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Journal Article
Surface characterization of nanoparticles: different surface analytical techniques compared
Kersting, R., Breitenstein, D., Hagenhoff, B., Fartmann, M., Heller, D., Grehl, T., Brüner, P., Niehuis, E.
Published in Surface and interface analysis (01.01.2013)
Published in Surface and interface analysis (01.01.2013)
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Journal Article
Conference Proceeding
MCs+ depth profiling using cluster primary ions
Niehuis, E., Grehl, T., Kollmer, F., Moellers, R., Rading, D., Kersting, R., Hagenhoff, B.
Published in Surface and interface analysis (01.01.2011)
Published in Surface and interface analysis (01.01.2011)
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Journal Article
Conference Proceeding
Novel Cluster Ion Beams For Secondary Ion Generation, Sputtering And FIB/SIMS Application
Kollmer, F., Rading, D., Moellers, R., Cramer, H., Paul, W., Niehuis, E.
Published in Microscopy and microanalysis (01.07.2012)
Published in Microscopy and microanalysis (01.07.2012)
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Journal Article
Chemical effects in C60 irradiation of polymers
MÖLLERS, R, TUCCITTO, N, TORRISI, V, NIEHUIS, E, LICCIARDELLO, A
Published in Applied surface science (01.07.2006)
Published in Applied surface science (01.07.2006)
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Conference Proceeding
Journal Article
Dual beam depth profiling of polymer materials: comparison of C 60 and Ar cluster ion beams for sputtering
Rading, D., Moellers, R., Cramer, H.‐G., Niehuis, E.
Published in Surface and interface analysis (01.01.2013)
Published in Surface and interface analysis (01.01.2013)
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Journal Article
Improvement of Biological Time-of-Flight-Secondary Ion Mass Spectrometry Imaging with a Bismuth Cluster Ion Source
Touboul, David, Kollmer, Felix, Niehuis, Ewald, Brunelle, Alain, Laprévote, Olivier
Published in Journal of the American Society for Mass Spectrometry (01.10.2005)
Published in Journal of the American Society for Mass Spectrometry (01.10.2005)
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Journal Article
Organic depth profiling of C 60 and C 60 /phthalocyanine layers using argon clusters
Mouhib, T., Poleunis, C., Möllers, R., Niehuis, E., Defrance, P., Bertrand, P., Delcorte, A.
Published in Surface and interface analysis (01.01.2013)
Published in Surface and interface analysis (01.01.2013)
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Journal Article
Chemical effects in C 60 irradiation of polymers
Möllers, R., Tuccitto, N., Torrisi, V., Niehuis, E., Licciardello, A.
Published in Applied surface science (30.07.2006)
Published in Applied surface science (30.07.2006)
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Journal Article
SIMS Imaging and 3D Microanalysis of Organic Structures
Havercroft, N, Rading, D, Kollmer, F, Niehuis, E
Published in Microscopy and microanalysis (01.07.2010)
Published in Microscopy and microanalysis (01.07.2010)
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Journal Article