by Nicolaidis, M.
Published in Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) (1999)

by Nicolaidis, M.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.02.2003)

by Calin, T., Nicolaidis, M., Velazco, R.
Published in IEEE transactions on nuclear science (01.12.1996)

by Nicolaidis, M, Zorian, Y
Published in Journal of electronic testing (01.02.1998)

by Nicolaidis, M.
Published in IEEE transactions on computers (01.10.1996)

by Anghel, L., Nicolaidis, M.
Published in Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537) (2000)

by Nicolaidis, M., Achouri, N., Anghel, L.
Published in 22nd IEEE VLSI Test Symposium, 2004. Proceedings (2004)

by Nicolaidis, M.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.05.1994)

by Alexandrescu, D., Anghel, L., Nicolaidis, M.
Published in 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings (2002)

by Gill, Balkaran, Nicolaidis, Michael, Wolff, Francis, Papachristou, Chris, Garverick, Steven
Published in Design, Automation and Test in Europe (07.03.2005)

by Chaix, F, Avresky, D, Zergainoh, N-E, Nicolaidis, M
Published in 2011 Design, Automation & Test in Europe (01.03.2011)

by Nicolaidis, M.
Published in IEEE transactions on computers (01.01.1998)

by Nicolaidis, M.
Published in International Test Conference, 2003. Proceedings. ITC 2003 (2003)

by Nicolaidis, Michael
Published in Integration (Amsterdam) (01.12.1998)

by Alexandrescu, Dan, Anghel, Lorena, Nicolaidis, Michael
Published in Journal of electronic testing (01.08.2004)

by Nicolaidis, M.
Published in Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) (1998)

by Papavramidou, Panagiota, Nicolaidis, Michael
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.02.2020)

by Nicolaidis, M.
Published in Proceedings - International Test Conference (1997)

by Nicolaidis, Michael, Anghel, Lorena, Achouri, Nadir
Published in Journal of electronic testing (01.08.2005)

by Faccio, F, Kloukinas, K, Marchioro, A, Calin, T, Cosculluela, J, Nicolaidis, M, Velazco, R
Published in IEEE transactions on nuclear science (01.01.1999)