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Understanding metric-related pitfalls in image analysis validation

by Reinke, Annika, Tizabi, Minu D, Baumgartner, Michael, Eisenmann, Matthias, Heckmann-Nötzel, Doreen, Kavur, A Emre, Rädsch, Tim, Sudre, Carole H, Acion, Laura, Antonelli, Michela, Arbel, Tal, Bakas, Spyridon, Benis, Arriel, Blaschko, Matthew, Buettner, Florian, Cardoso, M Jorge, Cheplygina, Veronika, Chen, Jianxu, Christodoulou, Evangelia, Cimini, Beth A, Collins, Gary S, Farahani, Keyvan, Ferrer, Luciana, Galdran, Adrian, Bram van Ginneken, Glocker, Ben, Godau, Patrick, Haase, Robert, Hashimoto, Daniel A, Hoffman, Michael M, Huisman, Merel, Isensee, Fabian, Jannin, Pierre, Kahn, Charles E, Kainmueller, Dagmar, Kainz, Bernhard, Karargyris, Alexandros, Karthikesalingam, Alan, Kenngott, Hannes, Kleesiek, Jens, Kofler, Florian, Kooi, Thijs, Kopp-Schneider, Annette, Kozubek, Michal, Kreshuk, Anna, Kurc, Tahsin, Landman, Bennett A, Litjens, Geert, Madani, Amin, Maier-Hein, Klaus, Martel, Anne L, Mattson, Peter, Meijering, Erik, Menze, Bjoern, Moons, Karel G M, Müller, Henning, Brennan Nichyporuk, Nickel, Felix, Petersen, Jens, Rafelski, Susanne M, Rajpoot, Nasir, Reyes, Mauricio, Riegler, Michael A, Rieke, Nicola, Saez-Rodriguez, Julio, Sánchez, Clara I, Shetty, Shravya, Maarten van Smeden, Summers, Ronald M, Taha, Abdel A, Tiulpin, Aleksei, Tsaftaris, Sotirios A, Ben Van Calster, Varoquaux, Gaël, Wiesenfarth, Manuel, Yaniv, Ziv R, Jäger, Paul F, Maier-Hein, Lena
Published in arXiv.org (23.02.2024)

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