by Ni, Tianming, Liu, Dongsheng, Xu, Qi, Huang, Zhengfeng, Liang, Huaguo, Yan, Aibin
Published in IEEE transactions on very large scale integration (VLSI) systems (01.07.2020)

by Yan, Aibin, Hu, Yuanjie, Cui, Jie, Chen, Zhili, Huang, Zhengfeng, Ni, Tianming, Girard, Patrick, Wen, Xiaoqing
Published in IEEE transactions on computers (01.06.2020)

by Ni, Tianming, Yao, Yao, Chang, Hao, Lu, Lin, Liang, Huaguo, Yan, Aibin, Huang, Zhengfeng, Wen, Xiaoqing
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.10.2020)

by Ni, Tianming, Chang, Hao, Song, Tai, Xu, Qi, Huang, Zhengfeng, Liang, Huaguo, Yan, Aibin, Wen, Xiaoqing
Published in IEEE transactions on circuits and systems. II, Express briefs (01.11.2020)

by Yang, Kang, Wu, Dan, Gao, Wengen, Ni, Tianming, Zhang, Qiannian, Zhang, Hongwei, Huang, Dengchao
Published in IEEE transactions on instrumentation and measurement (2022)

by Liang, Huaguo, Xu, Xiumin, Huang, Zhengfeng, Jiang, Cuiyun, Lu, Yingchun, Yan, Aibin, Ni, Tianming, Ouyang, Yiming, Yi, Maoxiang
Published in IEEE transactions on nuclear science (01.12.2016)

by Yan, Aibin, Cao, Aoran, Xu, Zhelong, Cui, Jie, Ni, Tianming, Girard, Patrick, Wen, Xiaoqing
Published in Journal of electronic testing (01.08.2021)

by Song, Tai, Liang, Huaguo, Ni, Tianming, Huang, Zhengfeng, Lu, Yingchun, Wan, Jinlei, Yan, Aibin
Published in IEEE access (01.01.2020)

by Ni, Tianming, Chang, Hao, Yao, Yao, Li, Xueyun, Huang, Zhengfeng
Published in IEEE access (2019)

by Ni, Tianming, Chang, Hao, Zhu, Shidong, Lu, Lin, Li, Xueyun, Xu, Qi, Liang, Huaguo, Huang, Zhengfeng
Published in IEEE access (2019)

by Ni, Tianming, Si, Junwei, Gong, Xuehan, Zhang, Ke, Pan, Mingzhang
Published in Energy conversion and management (01.05.2022)

by Ni, Tianming, Si, Junwei, Lu, Fulu, Zhu, Yan, Pan, Mingzhang
Published in Journal of cleaner production (10.01.2022)

by Hao, Chang, Yong, Xu, Tianming, Ni
Published in 2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) (19.04.2021)

by Huang, Zhengfeng, Duan, Lanxi, Zhang, Yan, Ni, Tianming, Yan, Aibin
Published in IEEE transactions on aerospace and electronic systems (01.06.2023)

by Yan, Aibin, Li, Zhixing, Cui, Jie, Huang, Zhengfeng, Ni, Tianming, Girard, Patrick, Wen, Xiaoqing
Published in IEEE transactions on aerospace and electronic systems (01.06.2023)

by Huang, Zhengfeng, Bian, Jingchang, Lin, Yankun, Liang, Huaguo, Ni, Tianming
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.2024)

by Hao, Chang, Zhengfeng, Huang, Tianming, Ni
Published in 2021 IEEE International Test Conference in Asia (ITC-Asia) (18.08.2021)

by Yan, Aibin, Li, Zhixing, Cui, Jie, Huang, Zhengfeng, Ni, Tianming, Girard, Patrick, Wen, Xiaoqing
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.06.2023)

by Yan, Aibin, Wang, Litao, Cui, Jie, Huang, Zhengfeng, Ni, Tianming, Girard, Patrick, Wen, Xiaoqing
Published in IEEE transactions on very large scale integration (VLSI) systems (01.01.2024)

by Yan, Aibin, Liu, Runqi, Cui, Jie, Ni, Tianming, Girard, Patrick, Wen, Xiaoqing, Zhang, Jiliang
Published in IEEE transactions on circuits and systems. II, Express briefs (01.06.2023)