Method for 3D volume detection of semiconductor wafers with improved yield
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Year of Publication 02.08.2024
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Year of Publication 02.08.2024
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Method for measuring sample and microscope for implementing method
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Year of Publication 28.05.2024
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Year of Publication 28.05.2024
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Method for detecting defects in semiconductor sample in distorted sample image
NEWMAN JON T, MAYER STEFAN, TRUESTER, THOMAS, C, HOFFMANN, ULLI, KOERBER THOMAS
Year of Publication 19.03.2024
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Year of Publication 19.03.2024
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Parameterized x-ray scattering measurement using image slice tomography of semiconductor structures
NEWMAN JON T, STEPAN, HANS, M, BUXBAUM ANDREAS, FOCA, EDOARDO, COBB, TIMOTHY, KOLOKHOV DENIS
Year of Publication 27.10.2023
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Year of Publication 27.10.2023
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Method and apparatus for measuring semiconductor features for increased yield
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Year of Publication 02.08.2024
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Year of Publication 02.08.2024
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Needle guide system
SYKES KENNETH W, CREASY SARAH L, SOUTHARD JEANETTE E, NEWMAN JON B, PRINCE MATTHEW J, ROBBINS TAB
Year of Publication 11.05.2021
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Year of Publication 11.05.2021
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Needle guidance systems, devices, and methods thereof including RFID technology
SYKES KENNETH W, CREASY SARAH L, SOUTHARD JEANETTE E, NEWMAN JON B, PRINCE MATTHEW J, ROBBINS TAB
Year of Publication 05.03.2021
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Year of Publication 05.03.2021
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NEEDLE ASSEMBLY INCLUDING AN ALIGNED MAGNETIC ELEMENT
CLEVERLY RANDI, BURNSIDE EDDIE K, STUPAK JOSEPH J. JR, GUTHRIE MICHAEL S, MONTGOMERY SARAH L, HAMATAKE BRET, HOWELL GLADE H, HADLEY CHAD A, NEWMAN JON B, GOLDEN ROBERT N
Year of Publication 15.06.2015
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Year of Publication 15.06.2015
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