Marker Line Identification in Special Nuclear Material using Physics-Informed Autoencoding
Neuer, M. J., Henke, C.
Published in 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) (04.11.2023)
Published in 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) (04.11.2023)
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Conference Proceeding
Secure Blockchain Encryption of Homeland Security Reachback Data for Spectroscopic Radiation Measurements
Neuer, M. J., Henke, C.
Published in 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) (04.11.2023)
Published in 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) (04.11.2023)
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Conference Proceeding
Data Augmentation and Feature Engineering for Machine Learning in Neutron Activation Analysis
Brylew, K., Szczesniak, T., Grodzicka-Kobylka, M., Janiak, L., Adamowski, L., Neuer, M. J.
Published in 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) (04.11.2023)
Published in 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) (04.11.2023)
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Conference Proceeding
A System for Elemental Analysis of Aluminum Chips, based on Neutron Activation Analysis
Szczesniak, T., Grodzicka-Kobylka, M., Brylew, K., Adamowski, L., Grodzicki, K., Janiak, L., Dziedzic, A., Sitek, M., Syntfeld-Kazuch, A., Zastawny, H., Gajderowicz, A., Peregrin, F., Baldi, T., da Silva Lopez, M., Neuer, M. J., Kleimt, B.
Published in 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) (04.11.2023)
Published in 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) (04.11.2023)
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Conference Proceeding