Investigation of single crystal 4H-SiC growth by the Solvent–Laser Heated Floating Zone technique
Woodworth, A.A., Neudeck, P.G., Sayir, A., Solá, F., Dudley, M., Raghothamachar, B.
Published in Journal of crystal growth (15.04.2014)
Published in Journal of crystal growth (15.04.2014)
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Journal Article
Nucleation of 3C-SiC associated with threading edge dislocations during chemical vapor deposition
Abadier, M., Berechman, R.A., Neudeck, P.G., Trunek, A.J., Skowronski, M.
Published in Journal of crystal growth (15.05.2012)
Published in Journal of crystal growth (15.05.2012)
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Journal Article
Possible formation mechanisms for surface defects observed in heteroepitaxially grown 3C-SiC
Speer, K. M., Neudeck, P. G., Crimp, M. A., Burda, C., Pirouz, P.
Published in Physica status solidi. A, Applications and materials science (01.07.2007)
Published in Physica status solidi. A, Applications and materials science (01.07.2007)
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Conference Proceeding
Diffraction Contrast of Threading Dislocations in GaN and 4H-SiC Epitaxial Layers Using Electron Channeling Contrast Imaging
Twigg, M. E., Picard, Y. N., Caldwell, J. D., Eddy, C. R., Mastro, M. A., Holm, R. T., Neudeck, P. G., Trunek, A. J., Powell, J. A.
Published in Journal of electronic materials (01.06.2010)
Published in Journal of electronic materials (01.06.2010)
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Conference Proceeding
Chemical Analysis of Materials Exposed to Venus Temperature and Surface Atmosphere
Lukco, D., Spry, D. J., Harvey, R. P., Costa, G. C. C., Okojie, R. S., Avishai, A., Nakley, L. M., Neudeck, P. G., Hunter, G. W.
Published in Earth and space science (Hoboken, N.J.) (01.07.2018)
Published in Earth and space science (Hoboken, N.J.) (01.07.2018)
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(Invited) High Temperature Wireless Smart Sensor Technology Based on Silicon Carbide Electronics
Hunter, Gary W., Scardelletti, M. C., Ponchak, G. E., Beheim, G. M., Mackey, J. A., Spry, D. J., Meredith, R. D., Dynys, F. W., Neudeck, P G, Jordan, J. L., Chen, L. Y., Harsh, K., Zorman, Christian A.
Published in ECS transactions (20.03.2014)
Published in ECS transactions (20.03.2014)
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Journal Article
Greatly improved 3C-SiC p-n junction diodes grown by chemical vapor deposition
Neudeck, P.G., Larkin, D.J., Starr, J.E., Powell, J.A., Salupo, C.S., Matus, L.G.
Published in IEEE electron device letters (01.03.1993)
Published in IEEE electron device letters (01.03.1993)
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Journal Article
Electrical characterization of a JFET-accessed GaAs dynamic RAM cell
Neudeck, P.G., Dungan, T.E., Melloch, M.R., Cooper, J.A.
Published in IEEE electron device letters (01.11.1989)
Published in IEEE electron device letters (01.11.1989)
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Journal Article
Characterization of hard- and soft-switching performance of high-voltage Si and 4H-SiC PiN diodes
Shenai, K., Trivedi, M., Neudeck, P.G.
Published in IEEE transactions on electron devices (01.09.2002)
Published in IEEE transactions on electron devices (01.09.2002)
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Journal Article
Intermodulation-distortion performance of silicon-carbide Schottky-barrier RF mixer diodes
Simons, R.N., Neudeck, P.G.
Published in IEEE transactions on microwave theory and techniques (01.02.2003)
Published in IEEE transactions on microwave theory and techniques (01.02.2003)
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Journal Article
EVOLUTION OF STRAIN THROUGHOUT GALLIUM NITRIDE DEPOSITED ON SILICON CARBIDE
Mastro, M A, Bassim, N D, Freitas, J A, Twigg, M E, Eddy, C R, Gaskill, D K, Henry, R L, Holm, R T, Kim, J, Neudeck, P G, Trunek, A J, Powell, J A
Published in Journal of Ceramic Processing & Research (01.01.2007)
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Published in Journal of Ceramic Processing & Research (01.01.2007)
Journal Article
TEM Observation on Single Defect in SiC
Liu, J. Q., Skowronski, M., Neudeck, P. G., Powell, J. A.
Published in Microscopy and microanalysis (01.08.2002)
Published in Microscopy and microanalysis (01.08.2002)
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Journal Article
Extremely low-leakage GaAs P-i-N junctions and memory capacitors grown by atomic layer epitaxy
Bedair, S.M., McDermott, B.T., Reid, K.G., Neudeck, P.G., Cooper, J.A., Melloch, M.R.
Published in IEEE electron device letters (01.06.1990)
Published in IEEE electron device letters (01.06.1990)
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