Comparative study of the accuracy of characterization of thin films a-Si on glass substrates from their interference normal incidence transmittance spectrum by the Tauc-Lorentz-Urbach, the Cody-Lorentz-Urbach, the optimized envelopes and the optimized graphical methods
Minkov, D A, Angelov, G V, Nestorov, R N, Marquez, E, Blanco, E, Ruiz-Perez, J J
Published in Materials research express (01.03.2019)
Published in Materials research express (01.03.2019)
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