Strain mapping and simulation of transistor structures in a 22nm FDSOI technology
Utess, Dirk, Kleimaier, Dominik Martin, Billan, Etienne, Youssuf, Tashfain, Zhao, Zhixing, Nemec, Thorgund, Meyer, Moritz Andreas, Rinderknecht, Jochen
Published in BIO web of conferences (2024)
Published in BIO web of conferences (2024)
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Journal Article
Multi-gate FeFET Discriminates Spatiotemporal Pulse Sequences for Dendrocentric Learning
Chen, Hugo J.-Y., Beauchamp, Matthew, Toprasertpong, Kasidit, Huang, Fei, Le Coeur, Louis, Nemec, Thorgund, Wong, H.-S. Philip, Boahen, Kwabena
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
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Conference Proceeding