Incorporating Component-Level Testing into Bayesian Degradation Distributions to Estimate a Voltage Regulator's Radiation Failure Probabilities
Nederlander, Richard H., Witulski, Arthur F., Reed, Robert A., Karsai, Gabor, Ladbury, Ray L., Zhang, En Xia, Schrimpf, Ronald D., Ryder, Kaitlyn L., Campola, Michael J., Mahadevan, Nag, Austin, Rebekah A., Sierawski, Brian D.
Published in IEEE transactions on nuclear science (01.08.2023)
Published in IEEE transactions on nuclear science (01.08.2023)
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