by Nayfeh, O.M., Rao, S., Smith, A., Therrien, J., Nayfeh, M.H.
Published in IEEE photonics technology letters (01.08.2004)

by Nayfeh, H.M., Singh, D.V., Hergenrother, J.M., Sleight, J.W., Ren, Z., Dokumaci, O., Black, L., Chidambarrao, D., Venigalla, R., Pan, J., Natzle, W., Tessier, B.L., Ott, J.A., Khare, M., Guarini, K.W., Ieong, M., Haensch, W.
Published in IEEE electron device letters (01.04.2006)

by Smith, A, Belomoin, G, Nayfeh, M.H, Nayfeh, Taysir
Published in Chemical physics letters (29.04.2003)

by Hoyt, J.L., Nayfeh, H.M., Eguchi, S., Aberg, I., Xia, G., Drake, T., Fitzgerald, E.A., Antoniadis, D.A.
Published in Digest. International Electron Devices Meeting (2002)

by Smith, A, Chaieb, S, al Aql, A, Alsalhi, M, Nayfeh, M H
Published in Journal of nanoscience and nanotechnology (01.10.2002)

by Nayfeh, H.M., Hoyt, J.L., Antoniadis, D.A.
Published in IEEE transactions on electron devices (01.12.2004)

by Wadje, Ninad S, Neeli, Vijaya Bhaskara, Jindal, R P, Nayfeh, H M, Todi, R
Published in 2010 IEEE International SOI Conference (SOI) (01.10.2010)

by Nayfeh, M.H., Satish Rao, Nayfeh, O.M., Smith, A., Therrien, J.
Published in IEEE transactions on nanotechnology (01.11.2005)

by Nayfeh, H.M., Leitz, C.W., Pitera, A.J., Fitzgerald, E.A., Hoyt, J.L., Antoniadis, D.A.
Published in IEEE electron device letters (01.04.2003)

by Guangrui Xia, Nayfeh, H.M., Lee, M.L., Fitzgerald, E.A., Antoniadis, D.A., Anjum, D.H., Jian Li, Hull, R., Klymko, N., Hoyt, J.L.
Published in IEEE transactions on electron devices (01.12.2004)

by Zheng, X., Hetrick, J., Yau, S.-T., Nayfeh, M.H.
Published in Ultramicroscopy (01.07.1992)

by Sentman, L H, Nayfeh, M H, Townsend, S W, King, K, Tsioulos, G, Bichanich, J
Published in Applied optics (2004) (01.11.1985)

by Choi, Yongki, Wang, Gang, Nayfeh, Munir H., Yau, Siu-Tung
Published in Biosensors & bioelectronics (15.06.2009)

by Arora, R., En Xia Zhang, Seth, S., Cressler, J. D., Fleetwood, D. M., Schrimpf, R. D., Rosa, G. L., Sutton, A. K., Nayfeh, H. M., Freeman, G.
Published in IEEE transactions on nuclear science (01.12.2011)

by Nayfeh, H.M., Rovedo, N., Bryant, A., Narasimha, S., Kumar, A., Xiaojun Yu, Ning Su, Kumar, A., Sleight, J.W., Robison, R.R., Rausch, W., Mallela, H., Freeman, G.
Published in IEEE transactions on electron devices (01.12.2009)

by M. Harb, L. Mili, A. H. Nayfeh, C-M. Chin, A.
Published in Electric machines and power systems (01.11.2000)

by Arora, R, Moen, K A, Madan, A, Cressler, J D, Enxia Zhang, Fleetwood, D M, Schrimpf, R D, Sutton, A K, Nayfeh, H M
Published in 2010 IEEE International Integrated Reliability Workshop Final Report (01.10.2010)

by Arora, R, Seth, S, Poh, J C H, Cressler, J D, Sutton, A K, Nayfeh, H M, Rosa, G L, Freeman, G
Published in 2011 International Reliability Physics Symposium (01.04.2011)

by Glab, W, Nayfeh, M H
Published in Optics letters (01.08.1982)

by Holt, Judson R., Harley, Eric C., Adam, Thomas N., Jeng, Shwu-Jen, Tabakman, Keith, Pal, Rohit, Nayfeh, Hasan M., Black, Linda R., Kempisty, Jeremy J., Stoker, Matthew W., Dube, Abhishek, Schepis, Dominic J.
Published in ECS transactions (2009)