by Sharma, S., Letavic, T., Yun Shi, Loiseau, A., Monaghan, J.-E, Feilchenfeld, N., Phelps, R., Lamothe, C., Cook, D., Dunn, J., Roerher, G., Nauschnig, H., Minixhofer, R.
Published in 2012 24th International Symposium on Power Semiconductor Devices and ICs (01.06.2012)