A Probabilistic Analysis Technique Applied to a Radiation-Hardened-by-Design Voltage-Controlled Oscillator for Mixed-Signal Phase-Locked Loops
Loveless, T.D., Massengill, L.W., Bhuva, B.L., Holman, W.T., Casey, M.C., Reed, R.A., Nation, S.A., McMorrow, D., Melinger, J.S.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Measurement and Analysis of Interconnect Crosstalk Due to Single Events in a 90 nm CMOS Technology
Balasubramanian, A., Amusan, O.A., Bhuva, B.L., Reed, R.A., Sternberg, A.L., Massengill, L.W., McMorrow, D., Nation, S.A., Melinger, J.S.
Published in IEEE transactions on nuclear science (01.08.2008)
Published in IEEE transactions on nuclear science (01.08.2008)
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Journal Article
Laser Dose-Rate Simulation to Complement LINAC Discrete Device Data
Nation, S.A., Massengill, L.W., McMorrow, D., Evans, L., Straatveit, A.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Single-Event Effects on Combinational Logic Circuits Operating at Ultra-Low Power
Casey, M.C., Amusan, O.A., Nation, S.A., Loveless, T.D., Balasubramanian, A., Bhuva, B.L., Reed, R.A., McMorrow, D., Weller, R.A., Alles, M.L., Massengill, L.W., Melinger, J.S., Narasimham, B.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Pulsed Laser Single-Event Effects in Highly Scaled CMOS Technologies in the Presence of Dense Metal Coverage
Balasubramanian, A., McMorrow, D., Nation, S.A., Bhuva, B.L., Reed, R.A., Massengill, L.W., Loveless, T.D., Amusan, O.A., Black, J.D., Melinger, J.S., Baze, M.P., Ferlet-Cavrois, V., Gaillardin, M., Schwank, J.R.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Laser Verification of On-Chip Charge-Collection Measurement Circuit
Amusan, O.A., Fleming, P.R., Bhuva, B.L., Massengill, L.W., Witulski, A.F., Balasubramanian, A., Casey, M.C., McMorrow, D., Nation, S.A., Barsun, F., Melinger, J.S., Gadlage, M.J., Loveless, T.D.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Single-event effects on ultra-low power CMOS circuits
Casey, M.C., Bhuva, B.L., Nation, S.A., Amusan, O.A., Loveless, T.D., Massengill, L.W., McMorrow, D., Melinger, J.S.
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
Experimental verification of Single Event interconnect crosstalk in a 90 nm CMOS technology
Balasubramanian, A., Amusan, O.A., Bhuva, B.L., Reed, R.A., Sternberg, A.L., Massengill, L.W., McMorrow, D., Nation, S.A., Melinger, J.S.
Published in 2007 9th European Conference on Radiation and Its Effects on Components and Systems (01.09.2007)
Published in 2007 9th European Conference on Radiation and Its Effects on Components and Systems (01.09.2007)
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Conference Proceeding