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Year of Publication 16.08.2023
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Device specific characterization of yield limiting pattern geometries by combining layout profiling with high sensitivity wafer inspection
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Published in 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2015)
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WAFER LEVEL SPATIAL SIGNATURE GROUPING USING TRANSFER LEARNING
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Wafer level spatial signature grouping using transfer learning
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Year of Publication 23.04.2024
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WAFER LEVEL SPATIAL SIGNATURE GROUPING USING TRANSFER LEARNING
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Year of Publication 29.03.2023
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Year of Publication 29.03.2023
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WAFER LEVEL SPATIAL SIGNATURE GROUPING USING TRANSFER LEARNING
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Year of Publication 03.03.2022
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Year of Publication 03.03.2022
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Wafer Level Spatial Signature Grouping Using Transfer Learning
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Year of Publication 03.03.2022
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Year of Publication 03.03.2022
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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES
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Year of Publication 27.09.2023
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Year of Publication 27.09.2023
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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES
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Year of Publication 23.06.2022
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Year of Publication 23.06.2022
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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES
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Year of Publication 23.06.2022
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Year of Publication 23.06.2022
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Wafer level signature grouping using transfer learning
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Year of Publication 01.07.2022
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Year of Publication 01.07.2022
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System and method for automatically identifying defect-based test coverage gaps in semiconductor devices
LENOX, CHET V, NARASIMHAN, NARAYANI, SAVILLE, BARRY, RATHERT, ROBERT J, VON DEN HOFF, MIKE, SHERMAN, KARA L, PRICE, DAVID W, LIM, TENG SONG, DONZELLA, ORESTE, ROBINSON, JOHN, GROOS, THOMAS, LACH, JUSTIN
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Year of Publication 01.11.2022
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