by LASKY, J. B, NAKOS, J. S, CAIN, O. J, GEISS, P. J
Published in IEEE transactions on electron devices (01.02.1991)

by Matthiesen, D.H., Wargo, M.J., Motakef, S., Carlson, D.J., Nakos, J.S., Witt, A.F.
Published in Journal of crystal growth (01.11.1987)

by Warren, J.W, Harrison, D.L, Agarwal, D.C, Rochau, G.E, Nakos, J.T, Kelly, J.E
Published in Nuclear engineering and design (01.11.1999)

by Nakos, J.
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)

by WHILEY, David M, JACOB, Kevin, NAKOS, Jennifer, BLETCHLY, Cheryl, NIMMO, Graeme R, NISSEN, Michael D, SLOOTS, Theo P
Published in Journal of antimicrobial chemotherapy (01.06.2012)

by Preuss, H., Nakos, J., Adams, E., Burnham, J.
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)

by Koburger, C, Adkisson, J, Clark, W, Davari, B, Geissler, S, Givens, J, Hansen, H, Holmes, S, Lee, H K, Lee, J, Luce, S, Martin, D, Mittl, S, Nakos, J, Stiffler, S
Published in Digest of technical papers - Symposium on VLSI Technology (01.01.1994)

by Voldman, S., Geissler, S., Nakos, J., Pekarik, J., Gauthier, R.
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)

by BURNHAM JAY S.,ELLIS-MONAGHAN JOHN J.,NAKOS JAMESS.,QUINLIVAN JAMES J
Year of Publication 28.02.2007

by WARREN, J. W, HARRISON, D. L, AGARWAL, D. C, ROCHAU, G. E, NAKOS, J. T, KELLY, J. E
Published in Nuclear engineering and design (1999)

by Warren, J W, Harrison, D L, Agarwal, D C, Rochau, G E, Nakos, J T, Kelly, J E
Published in Nuclear engineering and design (21.10.1996)

by Lasky, J B, Nakos, J S, Cain, O J, Geiss, P J
Published in IEEE transactions on electron devices (01.02.1991)

by Lasky, J B, Nakos, J S, Cain, O J, Geiss, P J
Published in IEEE transactions on electron devices (01.01.1991)

by Park, H., Clark, W., Mocuta, A.C., Holt, J., Mo, R., Sato, T., Mocuta, D., Lee, B.H., Dokumaci, O., O'Neil, P., Brown, D., Rausch, W., Suenaga, J., Li, Y., Brown, L., Nakos, J., Hathorn, K., Ronsheim, P., Kimura, H., Doris, B., Sudo, G., Scheer, K., Utomo, H., Mittl, S., Wagner, T., Umebayashi, T., Tsukamoto, M., Kohyama, Y., Cheek, J., Yang, I., Kuroda, H., Toyoshima, Y., Pellerin, J., Matsumoto, K., Schepis, D., Agnello, P., Welser, J., Nii, H., Kawanaka, S., Fisher, P., Oh, S.-H., Snare, J.
Published in IEEE International Electron Devices Meeting 2003 (2003)

by Koburger, C., Adkisson, J., Clark, W., Davari, B., Geissler, S., Givens, J., Hansen, H., Holmes, S., Lee, H.K., Lee, J., Luce, S., Martin, D., Mittl, S., Nakos, J., Stiffler, S.
Published in Proceedings of 1994 VLSI Technology Symposium (1994)

by Strong, A.W., Stamper, A.K., Bolam, R.J., Furukawa, T., Gow, C.J., Gow, T.R., Martin, D.W., Mittl, S.W., Nakos, J.S., Pennington, S.L.
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)