Development of 16 Mb NRAM Aiming for High Reliability, Small Cell Area, and High Switching Speed
Saito, Hitoshi, Watanabe, J., Seino, J., Tamura, T., Sashida, N., Hara, K., Kawabata, K., Fujii, A., Ohno, J., Nakakubo, A., Kojima, M., Shimoyama, T., Wada, H., Cleveland, L., Luan, H., Sen, R., Leong, N., Gallagher, T., Rueckes, T.
Published in 2021 IEEE International Memory Workshop (IMW) (01.05.2021)
Published in 2021 IEEE International Memory Workshop (IMW) (01.05.2021)
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Conference Proceeding
Quantum mechanical effect in temperature dependence of threshold voltage of extremely thin SOI MOSFETs
Omura, Yasuhisa, Nakakubo, Atsushi, Nakatsuji, Hiroshi
Published in Solid-state electronics (01.09.2004)
Published in Solid-state electronics (01.09.2004)
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Journal Article